公开(公告)号：US08830475B1

公开(公告)日：2014-09-09

申请号：US13969634

申请日：2013-08-19

Applicant: National Cheng Kung University

Inventor： Wei-Chih Wang ,  Benjamin Estroff ,  Chih-Han Chang ,  Fong-Chin Su

IPC: G01J3/45 ,  G01B9/02

CPC classification number: G01J3/45 ,  G01J3/021 ,  G01J3/4531 ,  G01J3/4532

Abstract: Disclosed is an interferometer comprising a light source, a reflective element, and a photodetector. The light source is configured to emit a light beam, and an angle is formed by inclusion between a direction to which the light beam travels and the reflective element, the photodetector is configured to be substantially perpendicular to the reflective element. The light beam is halved into a first light beam propagating by the included angle, and a second light beam reflected off the reflective element, the first light beam and the second light beam interfere each other to form an interferogram on the photodetector, which detects the interferogram. By benefit of above, the interferometer does not need to reposition its parts in order to make adjustment to interferogram, thereby simplifying optical element setup and minimizing physical volume of the interferomger. Also disclosed is a spectrometer including the same interferometer and a Fourier-transform-capable analyzer.

Abstract translation: 公开了一种包括光源，反射元件和光电检测器的干涉仪。 光源被配置为发射光束，并且通过在光束行进的方向与反射元件之间包含形成角度，光电检测器被配置为基本上垂直于反射元件。 光束被分成一个以夹角传播的第一光束，并且从反射元件反射的第二光束，第一光束和第二光束彼此相互干涉以在光电检测器上形成干涉图，该光检测器检测 干涉图。 受益于上述，干涉仪不需要重新定位其部件以便调整干涉图，从而简化了光学元件的设置并使干涉仪的体积最小化。 还公开了包括相同干涉仪和具有傅里叶变换的分析仪的光谱仪。