Abstract:
Portable apparatus for measuring parameters of optical signals propagating concurrently in opposite directions in an optical transmission path between two elements, at least one of the elements being operative to transmit a first optical signal (S1) only if it continues to receive a second optical signal (S2) from the other (10) of said elements, comprises first and second connectors for connecting the apparatus into the optical transmission path in series therewith, and a device connected between the first and second connectors for propagating at least the second optical signal (S2) towards the one of the elements, and measuring the parameters of the concurrently propagating optical signals (S1, S2). The measurement results may be displayed by a suitable display unit. Where one element transmits signals at two different wavelengths, the apparatus may separate parts of the corresponding optical signal portion according to wavelength and process them separately.
Abstract:
A method comprises: acquiring, for a number nSOP of varied State-Of-Polarization analysis conditions of the input optical signal, nSOP polarization-analyzed optical spectrum traces; mathematically discriminating said signal contribution from said noise contribution within said optical signal bandwidth using said polarization-analyzed optical spectrum traces, said mathematically discriminating comprising: obtaining a differential polarization response that is related to the optical spectrum of said signal contribution by a constant of proportionality; estimating the constant of proportionality of a differential polarization response to the optical spectrum of said signal contribution; estimating the optical spectrum of said noise contribution from said input optical signal, within said optical signal bandwidth using said constant of proportionality and said differential polarization response; and determining said in-band noise parameter on said input optical signal from the mathematically discriminated noise contribution.
Abstract:
Portable apparatus for measuring parameters of optical signals propagating concurrently in opposite directions in an optical transmission path between two elements, at least one of the elements being operative to transmit a first optical signal (S1) only if it continues to receive a second optical signal (S2) from the other (10) of said elements, comprises first and second connectors for connecting the apparatus into the optical transmission path in series therewith, and a device connected between the first and second connectors for propagating at least the second optical signal (S2) towards the one of the elements, and measuring the parameters of the concurrently propagating optical signals (S1, S2). The measurement results may be displayed by a suitable display unit. Where one element transmits signals at two different wavelengths, the apparatus may separate parts of the corresponding optical signal portion according to wavelength and process them separately.
Abstract:
A polarization-related characteristic of an optical path is determined from a predetermined function of the mean-square of a plurality of differences between polarization-analyzed optical power parameters corresponding to pairs of wavelengths mutually spaced about a midpoint wavelength by a small optical frequency difference. At least some of the said differences correspond to wavelength pairs measured under conditions where at least one of midpoint wavelength, input state of polarization (I-SOP) or analyzed state of polarization (A-SOP) of a pair is different.
Abstract:
Portable apparatus for measuring parameters of optical signals propagating concurrently in opposite directions in an optical transmission path between two elements, at least one of the elements being operative to transmit a first optical signal (S1) only if it continues to receive a second optical signal (S2) from the other (10) of said elements, comprises first and second connectors for connecting the apparatus into the optical transmission path in series therewith, and a device connected between the first and second connectors for propagating at least the second optical signal (S2) towards the one of the elements, and measuring the parameters of the concurrently propagating optical signals (S1, S2). The measurement results may be displayed by a suitable display unit. Where one element transmits signals at two different wavelengths, the apparatus may separate parts of the corresponding optical signal portion according to wavelength and process them separately.
Abstract:
In a method of measuring cumulative polarization mode dispersion (PMD) along the length of a fiber-under-test (FUT), a polarization-sensitive optical time domain reflectometer (POTDR) is used to inject into the FUT plural series of light pulses arranged in several groups. Each group comprises at least two series having closely-spaced wavelengths and the same state of polarization (SOP). At least two of such groups are injected and corresponding OTDR traces obtained for each series by averaging the impulse-response signals of the several series in the group. The process is repeated for a number of groups. The PMD is obtained by normalizing the OTDR traces of all of the groups, then computing the difference between each normalized OTDR trace in one group and the corresponding normalized OTDR trace in another group, followed by the mean-square value of the differences. Finally, the PMD is computed as a predetermined function of the mean-square difference.
Abstract:
Apparatus for measuring polarization mode dispersion (PMD) of a device, e.g. a waveguide, comprises a broadband light source (10,12) for passing polarized broadband light through the device (14), an interferometer (20) for dividing and recombining light that has passed through the device to form interferograms, a polarization separator (30) for receiving the light from the interferometer and separating such received light along first and second orthogonal Feb. 25, 2003 Feb. 25, 2003 polarization states, detectors (32x,32y) for converting the first and second orthogonal polarization states, respectively, into corresponding first and second electrical signals (Px(τ),Py(τ)), and a processor (36) for computing the modulus of the difference and such, respectively, of the first and second electrical signals to produce a cross-correlation envelope (EC(τ)) and an auto-correlation envelope (Ec(τ)), and determining the polarization mode dispersion according to the expression PMD=where and τ is the delay difference between the paths of the interferometer.
Abstract:
A method comprises: acquiring, for a number nSOP of varied State-Of-Polarization analysis conditions of the input optical signal, nSOP polarization-analyzed optical spectrum traces, the distribution of the input optical signal of said SOP analysis conditions being approximately known; mathematically discriminating said signal contribution from said noise contribution within said optical signal bandwidth using said polarization-analyzed optical spectrum traces, said mathematically discriminating comprising: obtaining a differential polarization response that is related to the optical spectrum of said signal contribution by a constant of proportionality; estimating the constant of proportionality of a differential polarization response to the optical spectrum of said signal contribution as a function of said number nSOP; estimating the optical spectrum of said noise contribution from said input optical signal, within said optical signal bandwidth using said constant of proportionality and said differential polarization response; and determining said in-band noise parameter on said input optical signal from the mathematically discriminated noise contribution.
Abstract:
A property of a device that is dependent upon both wavelength and state of polarization is measured by; passing through the device an optical signal having its wavelength and SOP varied, the wavelength over a spectral range of the device and the SOP between four Mueller SOPs; measuring the insertion loss of the device for each of the four SOPS and at each wavelength; using the four insertion loss measurements for each of the four different states of polarization for each wavelength to compute the four elements of the first line of the Mueller matrix for each wavelength; and using the Mueller matrix elements, computing insertion loss variations for the device for a multiplicity of input states of polarization in addition to the four states of polarization for which the actual attenuation measurements were made and using the insertion loss variations to compute the polarization and wavelength dependent property.
Abstract:
Apparatus for measuring very low levels of polarization mode dispersion of optical devices, that is inexpensive, robust and portable, comprises a broadband source and a polarizer for directing substantially completely polarized broadband light into the device under test with the polarization in a plane substantially perpendicular to the propagation direction of the light. Light leaving the device is analyzed spectrally to produce a spectrum of intensity in dependence upon wavelength or frequency of such light for each of at least two mutually orthogonal polarization axes in a plane perpendicular to the propagation axis of the light leaving the device. The spectra are used to compute Stokes parameters s1, s2 and |s3| for each of a plurality of wavelengths within the bandwidth of the broadband light. The polarization mode dispersion of the device is characterized in dependence upon the Stokes parameters using one of several techniques including standard Fixed Analyzer techniques and polarimetric techniques, especially the Poincaré sphere technique. The apparatus is particularly suitable for measuring PMD of components of optical telecommunications systems, including optical fibers, optical isolators, couplers, light amplifiers, and dispersion compensators.