OPTICAL SENSOR BASED WITH MULTILAYERED PLASMONIC STRUCTURE COMPRISING A NANOPOROUS METALLIC LAYER
    1.
    发明申请
    OPTICAL SENSOR BASED WITH MULTILAYERED PLASMONIC STRUCTURE COMPRISING A NANOPOROUS METALLIC LAYER 审中-公开
    基于包含纳米金属层的多层等离子体结构的光传感器

    公开(公告)号:US20160178516A1

    公开(公告)日:2016-06-23

    申请号:US14909933

    申请日:2014-06-10

    Abstract: The invention is a SPR sensor that comprises a multi-layered plasmonic structure on a substrate for sensing. The SPR sensor has an enhanced figure of merit and lower limit of detection (system noise divided by the sensitivity) by at least two orders of magnitude than prior art SPR sensors. The plasmonic structure of the invention comprises a Nano-structured Porous Metal Layer (NPML) and at least one of: (a) buried dielectric layer under the nano-porous metal layer; (b) a nano-dimensional high index layer on top of the metal layer; and (c) a molecular layer for bio-functionalization adjacent to an analyte layer. The invention also encompasses many embodiments of measuring systems that comprise the SPR sensors of the invention with improved signal to noise ratio.

    Abstract translation: 本发明是一种SPR传感器,其包括用于感测的衬底上的多层等离子体激元结构。 SPR传感器具有增强的品质因数和检测下限(系统噪声除以灵敏度)比现有技术SPR传感器至少两个数量级。 本发明的等离子体结构包括纳米结构的多孔金属层(NPML)和以下至少一种:(a)在纳米多孔金属层下面的掩埋介电层; (b)金属层顶部的纳米尺寸高折射率层; 和(c)与分析物层相邻的用于生物官能化的分子层。 本发明还包括测量系统的许多实施例,其包括具有改善的信噪比的本发明的SPR传感器。

    FREQUENCY MODULATED MULTIPLE WAVELENGTH PARALLEL PHASE SHIFT INTERFEROMETRY

    公开(公告)号:US20190101380A1

    公开(公告)日:2019-04-04

    申请号:US16086796

    申请日:2017-03-16

    Abstract: Herein is provided a simplified method for performing multiple wavelength phase shift interferometry measurements that is implemented by modulating each of the monochromatic light sources with a different carrier frequency, combining them to a single beam, detecting all wavelengths simultaneously using the same detectors and separating them via Fourier analysis and demodulation of the data. This approach offers both a simplification to the optical system and reduces the duration of time required to perform the multiple wavelength measurement, based on a simple data extraction algorithm decoding the information for each wavelength. When combined with the parallel phase shift orthogonal polarization interferometric microscopy this method provides fast, stable, high precision 3D imaging and displacements sensing. Also disclosed are embodiments of optical systems designed to carry out the method.

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