公开(公告)号：US20170146567A1

公开(公告)日：2017-05-25

申请号：US15359578

申请日：2016-11-22

Applicant: Photon Dynamics, Inc.

Inventor： Gordon Yue ,  Lloyd Russell Jones ,  Neil Dang Nguyen ,  Kiran Jitendra ,  Kent Nguyen ,  Steven Aochi

IPC: G01R1/067 ,  G09G3/00 ,  G01R1/073

CPC classification number: G01R1/06794 ,  G01R1/06722 ,  G01R1/07307 ,  G01R1/07364 ,  G02F1/1309 ,  G02F1/13458 ,  G09G3/006

Abstract: A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.

公开(公告)号：US10962567B2

公开(公告)日：2021-03-30

申请号：US15359578

申请日：2016-11-22

Applicant: Photon Dynamics, Inc.

Inventor： Gordon Yue ,  Lloyd Russell Jones ,  Neil Dang Nguyen ,  Kiran Jitendra ,  Kent Nguyen ,  Steven Aochi

IPC: G01R1/073 ,  G01R1/067 ,  G02F1/13 ,  G09G3/00 ,  G02F1/1345

Abstract: A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.