公开(公告)号：US20240355602A1

公开(公告)日：2024-10-24

申请号：US18644360

申请日：2024-04-24

Applicant: Purdue Research Foundation

Inventor： Demid V. Sychev ,  Vladimir M. Shalaev ,  Alexandra Boltasseva ,  Peigang Chen ,  Morris Menghuan Yang ,  Colton B. Fruhling ,  Alexei Lagutchev ,  Alexander V. Kildishev

IPC: H01J43/04

CPC classification number: H01J43/04

Abstract: An ultrafast system for detecting incidence of a single photon is disclosed which includes a single photon avalanche detector having an inherent bandgap, a source of probe light configured to apply an incident beam onto the single photon avalanche detector, wherein the probe light is configured to apply energy less than the bandgap, and a probe beam detector, configured to receive a reflected probe beam from the single photon avalanche detector, wherein the probe beam detector is adapted to generate a signal signifying: i) incidence of a single photon from a control beam onto the single photon avalanche detector.