公开(公告)号：US20220317335A1

公开(公告)日：2022-10-06

申请号：US17713850

申请日：2022-04-05

Applicant: Purdue Research Foundation

Inventor： Vladimir M. Shalaev ,  Alexandra Boltasseva ,  Alexei Lagutchev ,  Alexander Senichev ,  Zachariah O. Martin ,  Demid Sychev ,  Samuel Peana ,  Xiaohui Xu

IPC: G02B1/00 ,  G02B5/22

Abstract: A photon emitter includes a multi-layer film. The multi-layer film includes a first material layer and a second material layer, and the multi-layer film includes an interface surface between the first and second material layers. The first material layer includes silicon nitride. The multi-layer film is formed by positioning the silicon nitride over the second material layer and energetically activating the combination of the first material layer and the second material layer. The interface surface is operable to emit single photons.

公开(公告)号：US20240355602A1

公开(公告)日：2024-10-24

申请号：US18644360

申请日：2024-04-24

Applicant: Purdue Research Foundation

Inventor： Demid V. Sychev ,  Vladimir M. Shalaev ,  Alexandra Boltasseva ,  Peigang Chen ,  Morris Menghuan Yang ,  Colton B. Fruhling ,  Alexei Lagutchev ,  Alexander V. Kildishev

IPC: H01J43/04

CPC classification number: H01J43/04

Abstract: An ultrafast system for detecting incidence of a single photon is disclosed which includes a single photon avalanche detector having an inherent bandgap, a source of probe light configured to apply an incident beam onto the single photon avalanche detector, wherein the probe light is configured to apply energy less than the bandgap, and a probe beam detector, configured to receive a reflected probe beam from the single photon avalanche detector, wherein the probe beam detector is adapted to generate a signal signifying: i) incidence of a single photon from a control beam onto the single photon avalanche detector.

公开(公告)号：US12007276B2

公开(公告)日：2024-06-11

申请号：US16362598

申请日：2019-03-22

Applicant: Purdue Research Foundation

Inventor： Rohith Chandrasekar ,  Amr Shaltout ,  Vladimir Shalaev ,  Alexander Chubykin ,  Alexei Lagutchev

IPC: G01J3/02 ,  G01J3/28 ,  G01J3/44 ,  G01N21/19 ,  G01N21/25

CPC classification number: G01J3/0237 ,  G01J3/2803 ,  G01J3/44 ,  G01N21/19 ,  G01N21/251

Abstract: A spectroscopic microscope device, including at least one array of metasurfaces, and at least one CCD array integrated with the array of metasurfaces. The metasurfaces in the array are configured to separately direct LCP an RCP components of light incident on the metasurface to separate pixels in the CCD array.