公开(公告)号：US20170110621A1

公开(公告)日：2017-04-20

申请号：US15275430

申请日：2016-09-25

Applicant: QING QIAN

Inventor： QING QIAN

IPC: H01L31/18 ,  H01L31/08

CPC classification number: G21K1/00 ,  G01N23/2076 ,  G21K1/06 ,  G21K2201/062 ,  G21K2201/064 ,  G21K2201/067 ,  H01L31/085 ,  H01L31/1804

Abstract: A method of preparing two dimension bent X-ray crystal analyzers in strips feature is provided. A crystal wafer in strips is bonded to a curved substrate which offers the desired focus length. A crystal wafer in strips is pressed against the surface of the substrate forming curved shape by anodic bonding or glue bonding. The bonding is permanently formed between crystal wafer and its substrate surface, which makes crystal wafer has same curvature as previously prepared substrate.