Freeform offner spectrometer
    1.
    发明授权

    公开(公告)号:US11898907B1

    公开(公告)日:2024-02-13

    申请号:US17948153

    申请日:2022-09-19

    CPC classification number: G01J3/0208 G01J3/04 G01J3/18 G01J3/2823

    Abstract: A spectrometer is configured to form a spectrally resolved image of electromagnetic radiation from an electromagnetic radiation source. The spectrometer can include an optical guide device configured to guide electromagnetic radiation along an optical path. The optical guide device can include a first prism positioned in the optical path. The optical guide device can further include a focusing optic. The first prism can include at least one freeform prism surface that comprises at least some degree of cylindrical curvature having freeform polynomial terms formed thereon, which surface can be a substantially cylindrical, a substantially acylindrical, or a substantially flat surface having freeform polynomial terms formed thereon.

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