Abstract:
A transmissive sampling module is provided, which is adapted to a spectrometer main body. The transmissive sampling module includes a light source assembly and a support base. The light source assembly is directly connected to the support base. The support base includes a tube body and at least one fixing member. The tube body surrounds an accommodating groove, and an extending direction of the tube body is not parallel to an optical path of the light source assembly, and the tube body includes a transparent portion, and the optical path of the light source assembly passes through the transparent portion and the accommodating groove. The at least one fixing member is disposed on the tube body and is adjustably protruded out of an inner surface of the tube body. A transmissive spectrometer is also provided.
Abstract:
A Compact and Athermal VNIR/SWIR Spectrometer utilizes a slit, a Mangin lens, a pupil lens adjacent to the diffraction grating, corrector lenses, a beam splitter, field lenses and SWIR and VNIR FPAs. In examples, two corrector lenses are used. Some examples do not utilize field lenses and beam splitter, some examples utilize only the SWIR radiation spectrum. By balancing the powers of the optical elements and Abbe numbers of glasses as well as usage of aspheric surfaces combinations, a monochromatic and polychromatic aberrational correction is achieved; by balancing optical elements refractive indices change with temperature an athermalization is achieved. The overall length of the spectrometer does not exceed 4 inches, and in some examples it is 2.5 inches. A wide field of view and a low F number are obtained with an operating wavelength range from approximately 400 to 2350 nm. The spectrometer is particularly suited to airborne applications.
Abstract:
An optical slit device that combines microelectromechanical design techniques, semiconductor laser technology, and micro-optics to provide a spectrometer entrance slit on a semiconductor substrate with integrated calibration light sources, which integrated light enters the entrance slit and is transmitted down the same optical path as a light source under test and by which the spectrometer can be wavelength calibrated in situ is disclosed.
Abstract:
A device for performing Raman spectroscopy is disclosed. The device comprises a sensor device comprising a transparent substrate having first and second opposite faces. The sensor device comprises a light source, a first grating, a first reflective element, and a light detector carried by the first face of the substrate. The light source is arranged to emit light towards the second face of the substrate and the light detector is directed at the second face of the substrate. The first grating is interposed between the light source and the light detector. The first reflective element is interposed between the light source and the first grating. The sensor device comprises a second grating and a second reflective element carried by the second face of the substrate, the second grating arranged to receive light from the light source and the second reflective element arranged to receive light from the first grating. The sensor device comprises a light-filtering layer disposed in the substrate between the first and second faces. The device for performing Raman spectroscopy comprises a fluidic device coupled to the sensor device next to the second face of the sensor device. The fluidic device comprises an analyte binding site next to the second face of the substrate, a port and a channel between the port and the analyte binding site for directing a test sample from the port to the analyte binding site. The light filtering layer comprises a first pair of light blocking regions arranged to provide a first aperture in a first optical path between the first grating and the detector and a second pair of light blocking regions arranged to provide a second aperture in a second optical path between the second grating and the analyte binding site.
Abstract:
A radiation detection technique employs field enhancing structures and electroluminescent materials to converts incident Terahertz (THz) radiation into visible light and/or infrared light. In this technique, the field-enhancing structures, such as split ring resonators or micro-slits, enhances the electric field of incoming THz light within a local area, where the electroluminescent material is applied. The enhanced electric field then induces the electroluminescent material to emit visible and/or infrared light via electroluminescent process. A detector such as avalanche photodiode can detect and measure the emitted light. This technique allows cost-effective detection of THz radiation at room temperatures.
Abstract:
The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (COGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. The location of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or a first anchor output slit even with large beam diffraction angle from the entrance slit or input slit, the second one being specific for a particular design goal of a curved-grating spectrometer.
Abstract:
An optical arrangement for a spectral analysis system, a method for producing an optical arrangement for a spectral analysis system and a spectral analysis system are disclosed. In an embodiment the optical arrangement includes a carrier substrate having a placement area for a frame and a base area, and a diffraction grating movably arranged in the frame, wherein the frame is arranged on the placement area in an inclined placement position with respect to the base area so that the diffraction grating, arranged in a base position, is inclined with respect to the base area.
Abstract:
A multi-mode imaging spectrometer that incorporates two orthogonally positioned entrance slits and is configurable between a first mode in which the system produces images of relatively wide spatial coverage with moderate spectral resolution, using a first one of the two slits, and a second mode in which the system produces images of a smaller spatial area with fine spectral resolution, using the other one of the two slits.
Abstract:
A spectrometer, in particular for being installed in a sensor module of a fluid analysis system, including a radiation source and the following components defining a beam path or being arranged along the beam path: a sample chamber for a fluid to be examined, a first lens, a diffraction element, a second lens and a detector. A restriction aperture for restricting the effective diameter of the light beam incident on the diffraction element is provided between the sample chamber and the diffraction element.
Abstract:
An optical emission spectroscopic (OES) instrument includes a spectrometer, a processor and an adjustable mask controlled by the processor. The adjustable mask defines a portion of an analytical gap imaged by the spectrometer. The instrument automatically adjusts the size and position of an opening in the mask, so the spectrometer images an optimal portion of plasma formed in the analytical gap, thereby improving signal and noise characteristics of the instrument, without requiring tedious and time-consuming manual adjustment of the mask during manufacture or use.