公开(公告)号：US11458576B2

公开(公告)日：2022-10-04

申请号：US16182478

申请日：2018-11-06

Applicant: SIGMA LABS, INC.

Inventor： Lars Jacquemetton ,  Vivek R. Dave ,  Mark J. Cola ,  Glenn Wikle ,  R. Bruce Madigan

IPC: B23K31/12 ,  B22F12/00 ,  B23K26/342 ,  B33Y10/00

Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.

公开(公告)号：US20190255654A1

公开(公告)日：2019-08-22

申请号：US16282004

申请日：2019-02-21

Applicant: Sigma Labs, Inc.

Inventor： Darren Beckett ,  Scott Betts ,  Martin Piltch ,  R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Alberto M. Castro ,  Roger Frye

IPC: B23K26/34 ,  B33Y10/00 ,  B33Y50/02 ,  B23K15/00 ,  B23K26/354

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.

公开(公告)号：US10717264B2

公开(公告)日：2020-07-21

申请号：US16234333

申请日：2018-12-27

Applicant: Sigma Labs, Inc.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Alberto Castro ,  Glenn Wikle ,  Lars Jacquemetton ,  Peter Campbell

IPC: G06F19/00 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/71 ,  G01N21/00 ,  H01L21/66 ,  G01N21/84 ,  G06N20/00

Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.

公开(公告)号：US20190039318A1

公开(公告)日：2019-02-07

申请号：US16052488

申请日：2018-08-01

Applicant: Sigma Labs, Inc.

Inventor： R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Darren Beckett ,  Alberto M. Castro

IPC: B29C64/393 ,  B22F3/105 ,  B23K26/03 ,  B33Y10/00 ,  B33Y50/02

CPC classification number: B29C64/393 ,  B22F3/1055 ,  B22F2003/1057 ,  B22F2203/11 ,  B23K15/0086 ,  B23K26/032 ,  B23K26/342 ,  B23K26/70 ,  B23K31/125 ,  B23K2101/001 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.

公开(公告)号：US20220388249A1

公开(公告)日：2022-12-08

申请号：US17839853

申请日：2022-06-14

Applicant: Sigma Labs, Inc.

Inventor： R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Darren Beckett ,  Alberto M. Castro

IPC: B29C64/393 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02 ,  B23K26/342 ,  B23K26/70 ,  B23K15/00 ,  B23K26/03 ,  B23K31/12 ,  B22F10/20

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.

公开(公告)号：US11938560B2

公开(公告)日：2024-03-26

申请号：US17839853

申请日：2022-06-14

Applicant: Sigma Labs, Inc.

Inventor： R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Darren Beckett ,  Alberto M. Castro

IPC: B23K26/03 ,  B22F12/90 ,  B23K15/00 ,  B23K26/342 ,  B23K26/70 ,  B23K31/12 ,  B29C64/393 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02 ,  B22F10/28 ,  B22F10/31 ,  B23K101/00

CPC classification number: B23K26/032 ,  B22F12/90 ,  B23K15/0086 ,  B23K26/342 ,  B23K26/70 ,  B23K31/125 ,  B29C64/393 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02 ,  B22F10/28 ,  B22F10/31 ,  B22F2203/11 ,  B23K2101/001

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.

公开(公告)号：US10207489B2

公开(公告)日：2019-02-19

申请号：US15282822

申请日：2016-09-30

Applicant: SIGMA LABS, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Alberto Castro ,  Glenn Wikle ,  Lars Jacquemetton ,  Peter Campbell

IPC: G06F19/00 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  G01N21/71 ,  H01L21/66 ,  G06N99/00 ,  G01N21/84

Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.

公开(公告)号：US11517984B2

公开(公告)日：2022-12-06

申请号：US16182478

申请日：2018-11-06

Applicant: SIGMA LABS, INC.

Inventor： Lars Jacquemetton ,  Vivek R. Dave ,  Mark J. Cola ,  Glenn Wikle ,  R. Bruce Madigan

IPC: B23K31/12 ,  B22F12/00 ,  B23K26/342 ,  B33Y10/00

Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.

公开(公告)号：US20220324056A1

公开(公告)日：2022-10-13

申请号：US17847038

申请日：2022-06-22

Applicant: Sigma Labs, Inc.

Inventor： Darren Beckett ,  Scott Betts ,  Martin Piltch ,  R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Alberto M. Castro ,  Roger Frye

IPC: B23K26/34 ,  B33Y10/00 ,  B23K26/354 ,  B23K15/00 ,  B33Y50/02 ,  B23K26/342 ,  B23K26/03 ,  B23K26/082 ,  B29C64/153 ,  B23K31/12 ,  B23K26/06

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.

公开(公告)号：US20200290154A1

公开(公告)日：2020-09-17

申请号：US16831232

申请日：2020-03-26

Applicant: Sigma Labs, Inc.

Inventor： Darren Beckett ,  Scott Betts ,  Martin Piltch ,  R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Alberto M. Castro ,  Roger Frye

IPC: B23K26/34 ,  B33Y10/00 ,  B23K26/354 ,  B23K15/00 ,  B33Y50/02 ,  B23K26/342 ,  B23K26/03 ,  B23K26/082 ,  B29C64/153 ,  B23K31/12 ,  B23K26/06

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.