Abstract:
Systems and methods for forced early failure of cells within a memory device are disclosed. A memory device such as a dynamic random-access memory (DRAM) chip is subjected to an elevated temperature and an electric field to cause unwanted particles within the chip to migrate rapidly into the circuit elements of a memory cell, thereby causing the memory cell to fail. Subsequent testing may identify this failed cell and verify that the remaining cells within the memory device are operational. By forcing the cell to fail prior to certification testing, the end user may be reasonably confident that the certification provided for the device will remain accurate for the lifetime of the device. In contrast, without this forced early failure, such unwanted particles may migrate after deployment and may cause cell failure while deployed resulting in a botched operation.
Abstract:
A data storage system, and a method of operation thereof, includes: a host initialization module for initializing a data storage unit; a command process module, coupled to the host initialization module, for processing a read command or a write command performed on the data storage unit; and a status scheduler module, coupled to the command process module, for generating a check status request to inquire a storage unit status of the data storage unit, wherein the check status request occurs without interrupting a host.
Abstract:
A data storage system, and a method of operation thereof, includes: a host initialization module for initializing a data storage unit; a command process module, coupled to the host initialization module, for processing a read command or a write command performed on the data storage unit; and a status scheduler module, coupled to the command process module, for generating a check status request to inquire a storage unit status of the data storage unit, wherein the check status request occurs without interrupting a host.
Abstract:
A solid state storage system, and method of operation thereof, including: a system interface configured to receive host commands; a controller, coupled to the system interface, configured to identify frequently read data blocks from the host commands; a non-volatile memory, coupled to the controller, configured for access of the frequently read data blocks; an error correction code unit, coupled to the controller, configured to provide health monitor parameters for the frequently read data blocks verified by the controller; and a redundant frequently read data (RFRD) area, coupled to the error correction code unit, configured to transfer a recovered data from the frequently read data blocks.
Abstract:
A solid state storage system, and method of operation thereof, including: a system interface configured to receive host commands; a controller, coupled to the system interface, configured to identify frequently read data blocks from the host commands; a non-volatile memory, coupled to the controller, configured for access of the frequently read data blocks; an error correction code unit, coupled to the controller, configured to provide health monitor parameters for the frequently read data blocks verified by the controller; and a redundant frequently read data (RFRD) area, coupled to the error correction code unit, configured to transfer a recovered data from the frequently read data blocks.
Abstract:
A solid state storage system, and method of operation thereof, including: a system interface configured to receive host commands; a controller, coupled to the system interface, configured to identify frequently read data blocks from the host commands; a non-volatile memory, coupled to the controller, configured for access of the frequently read data blocks; an error correction code unit, coupled to the controller, configured to provide health monitor parameters for the frequently read data blocks verified by the controller; and a redundant frequently read data (RFRD) area, coupled to the error correction code unit, configured to transfer a recovered data from the frequently read data blocks.