公开(公告)号：US20170262337A1

公开(公告)日：2017-09-14

申请号：US15066728

申请日：2016-03-10

Applicant: SMART Modular Technologies, Inc.

Inventor： Reuben J. Chang ,  Satyanarayan S. Iyer ,  Michael Rubino

IPC: G06F11/10 ,  G11C29/52 ,  G11C29/04 ,  G06F13/24

CPC classification number: G11C29/04 ,  G06F13/24 ,  G11C29/42 ,  G11C29/4401 ,  G11C29/50 ,  G11C29/52 ,  G11C2029/4402

Abstract: A memory module repair system, and a method of operation thereof, including: a memory controller; a volatile memory having memory chips coupled to the memory controller, the memory controller for testing the volatile memory; an ECC controller, coupled to the memory controller, for determining a failing bit location information of a failing bit within the volatile memory; and an error log storage coupled to the memory controller and the ECC controller for storing the failing bit location information.