公开(公告)号：US11442011B2

公开(公告)日：2022-09-13

申请号：US17259232

申请日：2019-07-10

Applicant: SUGENTECH, INC.

Inventor： Sungrak Kim ,  Huije Lee ,  Hosung Sohn ,  Seungbum Yoo ,  Mi-Jin Sohn

IPC: G01J3/44 ,  G01N21/64

Abstract: A fluorescent standard strip, according to the present invention, is for testing the reliability of the fluorescence intensity of a fluorescent strip used for an analyzer, the fluorescent standard strip having an effect whereby, for devices using a fluorescent substance, the inter-device deviation in fluorescence intensity is reduced, fluorescent signal linearity per fluorescent concentration level is secured, and device reliability may be tested by periodically checking faults, errors, deviations, etc. of the devices. In addition, the fluorescent standard strip, according to the present invention, has an effect whereby, even in an environment and state where light is frequently irradiated, the reduction of fluorescence intensity according to time may be minimized, i.e., the same level of fluorescence intensity may be maintained for a long period.