公开(公告)号：US11530952B2

公开(公告)日：2022-12-20

申请号：US17151207

申请日：2021-01-17

Applicant: Spectrove Inc.

Inventor： Kasra Khazeni

IPC: G01J3/453 ,  G01J3/02

Abstract: The present application relates to a system for performing time-resolved interferometric spectroscopy of incoming light. In some embodiments, the system includes one or more optical elements, a photo-detector, a capacitance detector, and one or more processors. Upon application of a varying input signal to the one or more optical elements, a change to an optical characteristic is caused resulting in a changing interference pattern produced by the incoming light incident on the one or more optical elements. During the application of the varying input signal, the photo-detector may detect an intensity of light output from the one or more optical elements and the capacitance detector may detect a capacitance of the one or more optical elements.

公开(公告)号：US20210223106A1

公开(公告)日：2021-07-22

申请号：US17151207

申请日：2021-01-17

Applicant: Spectrove Inc.

Inventor： Kasra Khazeni

IPC: G01J3/453 ,  G01J3/02

Abstract: The present application relates to a system for performing time-resolved interferometric spectroscopy of incoming light. In some embodiments, the system includes one or more optical elements, a photo-detector, a capacitance detector, and one or more processors. Upon application of a varying input signal to the one or more optical elements, a change to an optical characteristic is caused resulting in a changing interference pattern produced by the incoming light incident on the one or more optical elements. During the application of the varying input signal, the photo-detector may detect an intensity of light output from the one or more optical elements and the capacitance detector may detect a capacitance of the one or more optical elements.

公开(公告)号：US20230375408A1

公开(公告)日：2023-11-23

申请号：US18082659

申请日：2022-12-16

Applicant: Spectrove Inc.

Inventor： Kasra Khazeni

IPC: G01J3/453 ,  G01J3/02

CPC classification number: G01J3/4531 ,  G01J3/0208

Abstract: The present application relates to a system for performing time-resolved interferometric spectroscopy of incoming light. In some embodiments, the system includes one or more optical elements, a photo-detector, a capacitance detector, and one or more processors. Upon application of a varying input signal to the one or more optical elements, a change to an optical characteristic is caused resulting in a changing interference pattern produced by the incoming light incident on the one or more optical elements. During the application of the varying input signal, the photo-detector may detect an intensity of light output from the one or more optical elements and the capacitance detector may detect a capacitance of the one or more optical elements.