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公开(公告)号:US12271006B2
公开(公告)日:2025-04-08
申请号:US18231760
申请日:2023-08-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hsin-Yu Chen , Yen-Chiang Liu , Jiun-Jie Chiou , Jia-Syuan Li , You-Cheng Jhang , Shin-Hua Chen , Lavanya Sanagavarapu , Han-Zong Pan , Chun-Peng Li , Chia-Chun Hung , Ching-Hsiang Hu , Wei-Ding Wu , Jui-Chun Weng , Ji-Hong Chiang , Hsi-Cheng Hsu
IPC: H01L27/14 , G02B5/20 , G02B26/00 , G02B27/30 , G06V40/13 , H01L27/146 , H01L31/0216
Abstract: Disclosed is a cost-effective method to fabricate a multifunctional collimator structure for contact image sensors to filter ambient infrared light to reduce noises. In one embodiment, an optical collimator, includes: a dielectric layer; a substrate; a plurality of via holes; and a conductive layer, wherein the dielectric layer is formed over the substrate, wherein the plurality of via holes are configured as an array along a lateral direction of a first surface of the dielectric layer, wherein each of the plurality of via holes extends through the dielectric layer and the substrate from the first surface of the dielectric layer to a second surface of the substrate in a vertical direction, and wherein the conductive layer is formed over at least one of the following: the first surface of the first dielectric layer and a portion of sidewalls of each of the plurality of via holes, and wherein the conductive layer is configured so as to allow the optical collimator to filter light in a range of wavelengths.
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公开(公告)号:US12148236B2
公开(公告)日:2024-11-19
申请号:US18232756
申请日:2023-08-10
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: You-Cheng Jhang , Han-Zong Pan , Wei-Ding Wu , Jiu-Chun Weng , Hsin-Yu Chen , Cheng-San Chou , Chin-Min Lin
IPC: G06V40/13 , G02B27/30 , G06F3/041 , G06F21/32 , H01L27/146
Abstract: Optical sensors and their making methods are described herein. In some embodiments, a described sensing apparatus includes: an image sensor; a collimator above the image sensor, wherein the collimator includes an array of apertures; and an optical filtering layer above the collimator, wherein the optical filtering layer is configured to filter a portion of light to be transmitted into the array of apertures.
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公开(公告)号:US12092839B2
公开(公告)日:2024-09-17
申请号:US18222344
申请日:2023-07-14
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hsin-Yu Chen , Chun-Peng Li , Chia-Chun Hung , Ching-Hsiang Hu , Wei-Ding Wu , Jui-Chun Weng , Ji-Hong Chiang , Yen Chiang Liu , Jiun-Jie Chiou , Li-Yang Tu , Jia-Syuan Li , You-Cheng Jhang , Shin-Hua Chen , Lavanya Sanagavarapu , Han-Zong Pan , Hsi-Cheng Hsu
IPC: G02B27/30 , H01L27/146 , H01L31/0232
CPC classification number: G02B27/30 , H01L27/14625 , H01L31/02325
Abstract: Disclosed is a method to fabricate a multifunctional collimator structure In one embodiment, an optical collimator, includes: a dielectric layer; a substrate; and a plurality of via holes, wherein the dielectric layer is formed over the substrate, wherein the plurality of via holes are configured as an array along a lateral direction of a first surface of the dielectric layer, wherein each of the plurality of via holes extends through the dielectric layer and the substrate from the first surface of the dielectric layer to a second surface of the substrate in a vertical direction, wherein the substrate has a bulk impurity doping concentration equal to or greater than 1×1019 per cubic centimeter (cm−3) and a first thickness, and wherein the bulk impurity doping concentration and the first thickness of the substrate are configured so as to allow the optical collimator to filter light in a range of wavelengths.
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公开(公告)号:US11782284B2
公开(公告)日:2023-10-10
申请号:US17883592
申请日:2022-08-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hsin-Yu Chen , Yen-Chiang Liu , Jiun-Jie Chiou , Jia-Syuan Li , You-Cheng Jhang , Shin-Hua Chen , Lavanya Sanagavarapu , Han-Zong Pan , Chun-Peng Li , Chia-Chun Hung , Ching-Hsiang Hu , Wei-Ding Wu , Jui-Chun Weng , Ji-Hong Chiang , Hsi-Cheng Hsu
IPC: G02B27/30 , G02B5/20 , H01L27/14 , G02B26/00 , H01L27/146 , H01L31/0216 , G06V40/13
CPC classification number: G02B27/30 , G02B5/20 , G02B26/007 , G06V40/1312 , H01L27/1462 , H01L27/14625 , H01L31/02162 , B32B2551/00 , G06V40/1318
Abstract: Disclosed is a cost-effective method to fabricate a multifunctional collimator structure for contact image sensors to filter ambient infrared light to reduce noises. In one embodiment, an optical collimator, includes: a dielectric layer; a substrate; a plurality of via holes; and a conductive layer, wherein the dielectric layer is formed over the substrate, wherein the plurality of via holes are configured as an array along a lateral direction of a first surface of the dielectric layer, wherein each of the plurality of via holes extends through the dielectric layer and the substrate from the first surface of the dielectric layer to a second surface of the substrate in a vertical direction.
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公开(公告)号:US11514707B2
公开(公告)日:2022-11-29
申请号:US16869314
申请日:2020-05-07
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: You-Cheng Jhang , Han-Zong Pan , Wei-Ding Wu , Jui-Chun Weng , Hsin-Yu Chen , Cheng-San Chou , Chin-Min Lin
IPC: G06V40/13 , G06F3/041 , G02B27/30 , H01L27/146 , G06F21/32
Abstract: Optical sensors and their making methods are described herein. In some embodiments, a described sensing apparatus includes: an image sensor; a collimator above the image sensor, wherein the collimator includes an array of apertures; and an optical filtering layer above the collimator, wherein the optical filtering layer is configured to filter a portion of light to be transmitted into the array of apertures.
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公开(公告)号:US11448891B2
公开(公告)日:2022-09-20
申请号:US16655763
申请日:2019-10-17
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hsin-Yu Chen , Chun-Peng Li , Chia-Chun Hung , Ching-Hsiang Hu , Wei-Ding Wu , Jui-Chun Weng , Ji-Hong Chiang , Yen-Chiang Liu , Jiun-Jie Chiou , Li-Yang Tu , Jia-Syuan Li , You-Cheng Jhang , Shin-Hua Chen , Lavanya Sanagavarapu , Han-Zong Pan , Hsi-Cheng Hsu
IPC: G02B27/30 , H01L27/146 , H01L31/0232
Abstract: Disclosed is a method to fabricate a multifunctional collimator structure In one embodiment, an optical collimator, includes: a dielectric layer; a substrate; and a plurality of via holes, wherein the dielectric layer is formed over the substrate, wherein the plurality of via holes are configured as an array along a lateral direction of a first surface of the dielectric layer, wherein each of the plurality of via holes extends through the dielectric layer and the substrate from the first surface of the dielectric layer to a second surface of the substrate in a vertical direction, wherein the substrate has a bulk impurity doping concentration equal to or greater than 1×1019 per cubic centimeter (cm−3) and a first thickness, and wherein the bulk impurity doping concentration and the first thickness of the substrate are configured so as to allow the optical collimator to filter light in a range of wavelengths.
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公开(公告)号:US10532925B2
公开(公告)日:2020-01-14
申请号:US16114521
申请日:2018-08-28
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Shyh-Wei Cheng , Chih-Yu Wang , Hsi-Cheng Hsu , Hsin-Yu Chen , Ji-Hong Chiang , Jui-Chun Weng , Wei-Ding Wu
Abstract: The present disclosure relates to a micro-electromechanical system (MEMs) package. In some embodiments, the MEMs package has a plurality of conductive interconnect layers disposed within a dielectric structure over an upper surface of a first substrate. A heating element is electrically coupled to a semiconductor device within the first substrate by one or more of the plurality of conductive interconnect layers. The heating element is vertically separated from the first substrate by the dielectric structure. A MEMs substrate is coupled to the first substrate and has a MEMs device. A hermetically sealed chamber surrounding the MEMs device is disposed between the first substrate and the MEMs substrate. An out-gassing material is disposed laterally between the hermetically sealed chamber and the heating element.
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公开(公告)号:US10131536B2
公开(公告)日:2018-11-20
申请号:US15176365
申请日:2016-06-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Shyh-Wei Cheng , Chih-Yu Wang , Hsi-Cheng Hsu , Hsin-Yu Chen , Ji-Hong Chiang , Jui-Chun Weng , Wei-Ding Wu
Abstract: The present disclosure relates to a MEMs package having a heating element configured to adjust a pressure within a hermetically sealed chamber by inducing out-gassing of into the chamber, and an associated method. In some embodiments, the MEMs package has a CMOS substrate having one or more semiconductor devices arranged within a semiconductor body. A MEMs structure is connected to the CMOS substrate and has a micro-electromechanical (MEMs) device. The CMOS substrate and the MEMs structure form a hermetically sealed chamber abutting the MEMs device. A heating element is electrically coupled to the one or more semiconductor devices and is separated from the hermetically sealed chamber by an out-gassing layer arranged along an interior surface of the hermetically sealed chamber. By operating the heating element to cause the out-gassing layer to release a gas, the pressure of the hermetically sealed chamber can be adjusted after it is formed.
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公开(公告)号:US11861928B2
公开(公告)日:2024-01-02
申请号:US17993319
申请日:2022-11-23
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: You-Cheng Jhang , Han-Zong Pan , Wei-Ding Wu , Jiu-Chun Weng , Hsin-Yu Chen , Cheng-San Chou , Chin-Min Lin
IPC: G06V40/13 , G02B27/30 , G06F3/041 , G06F21/32 , H01L27/146
CPC classification number: G06V40/13 , G02B27/30 , G06F3/0412 , G06F21/32 , H01L27/14625
Abstract: Optical sensors and their making methods are described herein. In some embodiments, a described sensing apparatus includes: an image sensor; a collimator above the image sensor, wherein the collimator includes an array of apertures; and an optical filtering layer above the collimator, wherein the optical filtering layer is configured to filter a portion of light to be transmitted into the array of apertures.
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公开(公告)号:US11756883B2
公开(公告)日:2023-09-12
申请号:US16927249
申请日:2020-07-13
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Yung-Chi Lin , Hsin-Yu Chen , Lin-Chih Huang , Tsang-Jiuh Wu , Wen-Chih Chiou
IPC: H01L23/528 , H01L27/088 , H01L23/31 , H01L23/48 , H01L23/532 , H01L23/00 , H01L21/768 , H01L23/525
CPC classification number: H01L23/528 , H01L21/76898 , H01L23/3114 , H01L23/3171 , H01L23/481 , H01L23/53238 , H01L24/13 , H01L27/088 , H01L23/525 , H01L23/53223 , H01L23/53252 , H01L23/53266 , H01L23/53271 , H01L24/05 , H01L2224/0401 , H01L2224/05024 , H01L2224/0557 , H01L2224/05552 , H01L2224/05567 , H01L2224/05572 , H01L2224/06181 , H01L2224/13022 , H01L2224/13025 , H01L2224/13111 , H01L2924/00014 , H01L2924/12042 , H01L2924/13091 , H01L2224/05572 , H01L2924/00014 , H01L2224/13111 , H01L2924/01047 , H01L2924/01029 , H01L2924/00012 , H01L2924/00014 , H01L2224/05552 , H01L2924/13091 , H01L2924/00 , H01L2924/12042 , H01L2924/00
Abstract: A method comprises forming a trench extending through an interlayer dielectric layer over a substrate and partially through the substrate, depositing a photoresist layer over the trench, wherein the photoresist layer partially fills the trench, patterning the photoresist layer to remove the photoresist layer in the trench and form a metal line trench over the interlayer dielectric layer, filling the trench and the metal line trench with a conductive material to form a via and a metal line, wherein an upper portion of the trench is free of the conductive material and depositing a dielectric material over the substrate, wherein the dielectric material is in the upper portion of the trench.
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