公开(公告)号：US10962490B2

公开(公告)日：2021-03-30

申请号：US16066500

申请日：2016-12-28

Applicant: UNIVERSITY OF WASHINGTON

Inventor： Devon R. Mortensen ,  Gerald Todd Seidler

IPC: G01N23/20 ,  G01N23/20008 ,  G01N23/20016 ,  G01N23/20091 ,  G01N23/207 ,  G01N23/22 ,  G21K1/06

Abstract: An example method for aligning a spectrometer is described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector that are all positioned on an instrument plane. The method includes rotating the crystal analyzer about an axis that is within the instrument plane and perpendicular to a rotation plane such that (i) a reciprocal lattice vector of the crystal analyzer is within the instrument plane or (ii) a component of the reciprocal lattice vector within the rotation plane is perpendicular to the instrument plane. An origin of the reciprocal lattice vector is located on the axis. The method further includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment that is bounded by the detector and the radiation source. Example spectrometers related to the example method are also disclosed.

公开(公告)号：US20170184520A1

公开(公告)日：2017-06-29

申请号：US15392430

申请日：2016-12-28

Applicant: University of Washington

Inventor： Devon R. Mortensen ,  Gerald Todd Seidler

IPC: G01N23/20

CPC classification number: G01N23/20091 ,  G01N23/20008

Abstract: An example spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle and a sample stage configured to support a sample such that the sample is offset from the Rowland circle. The spectrometer further includes an x-ray source aligned to emit x-rays toward the sample and an entrance slit formed within a material that is opaque to x-rays. The entrance slit is fixedly coupled to the x-ray source such that the entrance slit defines a range of angles at which x-rays that are emitted by the sample and pass through the entrance slit are incident on the crystal analyzer. The spectrometer further includes a position-insensitive x-ray detector aligned to detect x-rays that are scattered by the crystal analyzer.