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    Methods for aligning a spectrometer
    2.
    发明授权
    Methods for aligning a spectrometer 有权

    公开(公告)号：US10962490B2

    公开(公告)日：2021-03-30

    申请号：US16066500

    申请日：2016-12-28

    Applicant: UNIVERSITY OF WASHINGTON

    Inventor： Devon R. Mortensen ,  Gerald Todd Seidler

    IPC: G01N23/20 ,  G01N23/20008 ,  G01N23/20016 ,  G01N23/20091 ,  G01N23/207 ,  G01N23/22 ,  G21K1/06

    Abstract: An example method for aligning a spectrometer is described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector that are all positioned on an instrument plane. The method includes rotating the crystal analyzer about an axis that is within the instrument plane and perpendicular to a rotation plane such that (i) a reciprocal lattice vector of the crystal analyzer is within the instrument plane or (ii) a component of the reciprocal lattice vector within the rotation plane is perpendicular to the instrument plane. An origin of the reciprocal lattice vector is located on the axis. The method further includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment that is bounded by the detector and the radiation source. Example spectrometers related to the example method are also disclosed.

    X-ray spectrometer and methods for use
    3.
    发明授权
    X-ray spectrometer and methods for use 有权

    公开(公告)号：US11054375B2

    公开(公告)日：2021-07-06

    申请号：US16333405

    申请日：2017-09-15

    Applicant: UNIVERSITY OF WASHINGTON

    Inventor： Gerald Todd Seidler ,  Oliver Hoidn ,  William Holden

    IPC: G01N23/207 ,  G01N23/20025 ,  G01N23/20091 ,  G01N23/20008 ,  G01T7/10 ,  G02B26/08 ,  G01T1/29 ,  G02B27/09 ,  G01N23/20

    Abstract: A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, an x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.

    X-Ray Spectrometer with Source Entrance Slit
    4.
    发明申请
    X-Ray Spectrometer with Source Entrance Slit 审中-公开

    公开(公告)号：US20170184520A1

    公开(公告)日：2017-06-29

    申请号：US15392430

    申请日：2016-12-28

    Applicant: University of Washington

    Inventor： Devon R. Mortensen ,  Gerald Todd Seidler

    IPC: G01N23/20

    CPC classification number: G01N23/20091 ,  G01N23/20008

    Abstract: An example spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle and a sample stage configured to support a sample such that the sample is offset from the Rowland circle. The spectrometer further includes an x-ray source aligned to emit x-rays toward the sample and an entrance slit formed within a material that is opaque to x-rays. The entrance slit is fixedly coupled to the x-ray source such that the entrance slit defines a range of angles at which x-rays that are emitted by the sample and pass through the entrance slit are incident on the crystal analyzer. The spectrometer further includes a position-insensitive x-ray detector aligned to detect x-rays that are scattered by the crystal analyzer.

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