公开(公告)号：US11579178B1

公开(公告)日：2023-02-14

申请号：US17647012

申请日：2022-01-04

Applicant: Unimicron Technology Corp.

Inventor： Hsin-Hung Lee ,  Chun-Hsien Chien ,  Yu-Chung Hsieh ,  Yi-Hsiu Fang ,  Tzyy-Jang Tseng

IPC: G01R29/08

Abstract: An inspection apparatus used for inspecting a bare circuit board is provided, where the bare circuit board includes an antenna. The inspection apparatus includes a holding stage, a probing device, and a measurement device. The holding stage can hold the bare circuit board. The measurement device is electrically connected to the probing device and electrically connected to the antenna via the probing device. The measurement device can input a first testing signal to the antenna. The antenna can input a second testing signal to the measurement device after receiving the first testing signal. The measurement device can measure the antenna according to the second testing signal, where the first testing signal and the second testing signal both pass through no active component.

公开(公告)号：US12219711B2

公开(公告)日：2025-02-04

申请号：US18155708

申请日：2023-01-17

Applicant: Unimicron Technology Corp.

Inventor： Chun-Hsien Chien ,  Hsin-Hung Lee ,  Hsuan-Yu Lai ,  Yu-Chung Hsieh ,  Hung-Pin Yu

IPC: H01Q1/48 ,  H05K1/11 ,  H05K1/18

Abstract: A bare circuit board is provided, in which the bare circuit board includes a substrate, an antenna, a chip pad, a ground pattern and a trace. The substrate includes a surface. The antenna and the chip pad are formed on the substrate. The ground pattern is formed on the surface. The trace is formed on the surface and isn't connected to the ground pattern. A measuring gap is formed between the trace and an edge of the ground pattern, and the trace includes a first end and a second end. The first end is electrically connected to the chip pad, whereas the second end is electrically connected to the antenna. The bare circuit board is adapted to transmit a signal. The width of the measuring gap is smaller than a quarter of an equivalent wavelength of the signal.

公开(公告)号：US12292468B2

公开(公告)日：2025-05-06

申请号：US18315474

申请日：2023-05-10

Applicant: Unimicron Technology Corp.

Inventor： Chun-Hsien Chien ,  Hsin-Hung Lee ,  Hsuan-Yu Lai ,  Yu-Chung Hsieh

IPC: G01R31/28

Abstract: An inspection system and an inspection method of a bare circuit board are provided. The inspection system is used for inspecting a bare circuit board. The bare circuit board includes a chip pad and an antenna. The inspection system includes an adapter board, a test device and a measure device. The adapter board includes a chip and a contact structure. The chip is electrically connected to the contact structure. The contact structure touches the chip pad so that the chip is electrically connected to the chip pad. The test device includes a transceiver antenna. The test device and the bare circuit board separate. The measure device is electrically connected to the chip or the transceiver antenna.