Automatic birefringence measuring apparatus
    1.
    发明授权
    Automatic birefringence measuring apparatus 失效
    自动双折射测量仪

    公开(公告)号:US3902805A

    公开(公告)日:1975-09-02

    申请号:US39812173

    申请日:1973-09-17

    Inventor: REDNER SALOMON

    CPC classification number: G01N21/23

    Abstract: Birefringence resulting from the relative retardation of light waves propagating at different speeds through a stressed plate or coating is measured automatically by splitting a light wave emerging from the stressed plate or coating into at least two beams, filtering each beam with a filter which transmits a different wave length, transforming the light intensity from each filter into electrical signals and using the electrical signals to measure the resulting phase shift which is directly proportional to the birefringence.

    Abstract translation: 通过将应力板或涂层的不同速度传播的光波的相对延迟产生的双折射通过将从应力板或涂层出现的光波分成至少两束来自动测量, 波长,将来自每个滤波器的光强度转换成电信号,并使用电信号来测量与双折射成正比的结果相移。

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