公开(公告)号：US10256002B2

公开(公告)日：2019-04-09

申请号：US15334886

申请日：2016-10-26

Applicant: X-RAY OPTICAL SYSTEMS, INC.

Inventor： Zewu Chen ,  Rory D. Delaney ,  John H. Burdett ,  Kai Xin

IPC: G21K1/06 ,  G01N23/207 ,  G01N23/223

Abstract: A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.

公开(公告)号：US20140294157A1

公开(公告)日：2014-10-02

申请号：US14128078

申请日：2012-10-25

Applicant: X-RAY OPTICAL SYSTEMS, INC.

Inventor： Zewu Chen ,  Rory D. Delaney ,  John H. Burdett ,  Kai Xin

IPC: G21K1/06

CPC classification number: G21K1/06 ,  G01N23/2076 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/308 ,  G01N2223/315 ,  G21K2201/064

Abstract: A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.

Abstract translation: 具有多个高度对准的弯曲X射线光学器件的支撑结构，所述支撑结构具有多个内部部分或完全同心的表面，所述光学元件安装在所述多个内部部分或完全同心的表面上，从而使所述光学元件沿着其中心光轴对准，因此与源， /或检测器结合使用该支撑结构。 表面可以嵌套在中心光轴周围; 并且支撑结构可以通过壁纵向分割成围绕中心光轴的部分。 X射线光学元件中的至少一个包括弯曲衍射光学元件，用于接收发散的X射线束并将光束聚焦到焦点区域，在一个实施例中是聚焦单色光学元件。 在改进的实施例中，光学元件包括单层，塑性变形的LiF光学器件。

公开(公告)号：US09343193B2

公开(公告)日：2016-05-17

申请号：US14727027

申请日：2015-06-01

Applicant: X-RAY OPTICAL SYSTEMS, INC.

Inventor： Zewu Chen ,  David M. Gibson ,  Walter M. Gibson ,  Adam Bailey ,  R. Scott Semken ,  Kai Xin ,  John H. Burdett, Jr.

IPC: G21K1/06 ,  G01N23/223 ,  G01N23/20 ,  H05G1/04

CPC classification number: G21K1/06 ,  G01N23/20008 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/1003 ,  G01N2223/315 ,  G01N2223/423 ,  G21K2201/062 ,  G21K2201/064 ,  H05G1/04

Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.

公开(公告)号：US09048001B2

公开(公告)日：2015-06-02

申请号：US14052078

申请日：2013-10-11

Applicant: X-RAY OPTICAL SYSTEMS, INC.

Inventor： Zewu Chen ,  David M. Gibson ,  Walter M. Gibson ,  Adam Bailey ,  R. Scott Semken ,  Kai Xin ,  John H. Burdett, Jr.

IPC: G21K1/06 ,  G01N23/223 ,  G01N23/20

CPC classification number: G21K1/06 ,  G01N23/20008 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/1003 ,  G01N2223/315 ,  G01N2223/423 ,  G21K2201/062 ,  G21K2201/064 ,  H05G1/04

Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.

Abstract translation: 一种用X射线束照射样品斑点的X射线分析装置。 提供具有源极点的X射线管，从该源点产生具有特征的第一能量和bre致辐射能量的发散X射线束; 第一x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时对光束进行单色; 并且第二x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时将光束单色化为第二能量。 第一个X射线光学元件可以对来自源光斑的特征能量进行单色化，第二个X射线光学元件可以从源光点单色bre致辐射能量。 x射线光学元件可以是弯曲的衍射光学器件，用于从X射线管接收发散的X射线束并将光束聚焦在样品点处。 还提供检测以检测和测量例如包括玩具和电子产品在内的制造产品中的各种毒素。