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公开(公告)号：US20240310228A1
公开(公告)日：2024-09-19
申请号：US18607543
申请日：2024-03-17
Applicant: Zhejiang University
Inventor： Wen He , Yaqi Shi , Qun Li , Jie Zhou , Shushi Jia
Abstract: The present application relates to a base strain generating device and a base strain sensitivity testing system. The base strain generating device clamps the middle portion of a strain beam by arranging a clamping assembly, so that the position of a mounting structure is fixed, and a tested sensor arranged at the mounting structure does not generate an additional acceleration component due to the vibration of the strain beam. By adoption of the technical solution, the measurement precision of the base strain sensitivity is improved.
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