Turbulence and winds aloft detection system and method
    2.
    发明授权
    Turbulence and winds aloft detection system and method 有权
    湍流和风高检测系统和方法

    公开(公告)号:US09068884B1

    公开(公告)日:2015-06-30

    申请号:US13685074

    申请日:2012-11-26

    Abstract: A turbulence and winds aloft detection system may include an image capturing device for capturing a plurality of images of a visual feature of a selected celestial object; and an image processor configured to compare the plurality of images of the visual feature to detect a transit of a turbule of turbulent air between the image capturing device and the selected celestial object; compensate for one or more of apparent visual motion of celestial objects due to a planet's translation and rotation, the moon's revolution about the planet, and the atmosphere's refractive displacement of celestial objects; and compute a measurement of at least one of a velocity of the turbule and a height of the turbule relative to the planet.

    Abstract translation: 湍流和风高的检测系统可以包括用于捕获所选天体的视觉特征的多个图像的图像捕获装置; 以及图像处理器,被配置为比较所述视觉特征的所述多个图像以检测所述图像捕获装置和所选择的天体之间的湍流空气的流过; 补偿由于行星的平移和旋转,月球对地球的革命以及大气的天体折射位移引起的天体视觉运动的一种或多种。 并且计算湍流的速度和湍流相对于行星的高度中的至少一个的测量。

    Quantity-of-light unevenness inspection apparatus, and quantity-of-light unevenness inspection method
    3.
    发明申请
    Quantity-of-light unevenness inspection apparatus, and quantity-of-light unevenness inspection method 审中-公开
    光量不均匀检查装置和光量不均匀性检查方法

    公开(公告)号:US20020121616A1

    公开(公告)日:2002-09-05

    申请号:US10087060

    申请日:2002-02-27

    Abstract: In the present invention, an image print mask 12H is photographed from a side across a light source 13 when the image print mask 12H for adjusting light so that a film is irradiated with the light is irradiated with the light, a luminance signal of the image print mask 12H is detected based on the photographed image on the image print mask 12H to create a luminance level waveform pattern 113A or 113B according to the luminance signal, and the luminance level waveform pattern 113A or 113B is displayed as the quantity-of-light unevenness of the light with which the image print mask 12H is irradiated, so that the luminance level waveform pattern 113A or 113Ba can make the user visually recognize the state of quantity-of-light unevenness of the light with which the image print mask 12H is irradiated.

    Abstract translation: 在本发明中,当用光照射光的调整光的图像打印掩模12H照射光时,从光源13的一侧拍摄图像打印掩模12H,图像的亮度信号 基于图像打印掩模12H上的拍摄图像检测打印掩码12H,以根据亮度信号创建亮度级波形图案113A或113B,并且亮度级波形图案113A或113B被显示为光量 图像打印掩模12H照射的光的不均匀性,使得亮度级波形图案113A或113Ba可以使用户可以视觉地识别图像打印掩码12H为止的光的光量不均匀的状态 照射。

    Solar-powered light intensity measurement device
    4.
    发明授权
    Solar-powered light intensity measurement device 失效
    太阳能光强测量装置

    公开(公告)号:US08228492B2

    公开(公告)日:2012-07-24

    申请号:US12583717

    申请日:2009-08-24

    Inventor: Chad E. Brokopp

    Abstract: There is provided a solar powered light intensity measurement device which includes one or more photovoltaic cells, one or more resistors and one or more light emitting diodes. The one or more photovoltaic cells convert light to electricity, the output corresponding to the intensity of incident light. Electrically activated from the photovoltaic cells, through the one or more resistors, the light emitting diodes emit a signal color, further corresponding to their electrical activation and hence to the intensity of light incident upon the one or more photovoltaic cells. The signal color is compared to reference color or chart for use in determining the relevant light intensity. In one embodiment, the device further includes an analog switch.

    Abstract translation: 提供了一种太阳能光强测量装置,其包括一个或多个光伏电池,一个或多个电阻器和一个或多个发光二极管。 一个或多个光伏电池将光转换成电,该输出对应于入射光的强度。 从光伏电池电激活,通过一个或多个电阻器,发光二极管发射信号颜色,进一步对应于它们的电激活,并因此发射入射到一个或多个光伏电池上的光的强度。 将信号颜色与参考颜色或图表进行比较,以用于确定相关的光强度。 在一个实施例中,该设备还包括模拟开关。

    Solar-powered light intensity measurement device
    5.
    发明申请
    Solar-powered light intensity measurement device 失效
    太阳能光强测量装置

    公开(公告)号:US20100045971A1

    公开(公告)日:2010-02-25

    申请号:US12583717

    申请日:2009-08-24

    Inventor: Chad E. Brokopp

    Abstract: There is provided a solar powered light intensity measurement device which includes one or more photovoltaic cells, one or more resistors and one or more light emitting diodes. The one or more photovoltaic cells convert light to electricity, the output corresponding to the intensity of incident light. Electrically activated from the photovoltaic cells, through the one or more resistors, the light emitting diodes emit a signal color, further corresponding to their electrical activation and hence to the intensity of light incident upon the one or more photovoltaic cells. The signal color is compared to reference color or chart for use in determining the relevant light intensity. In one embodiment, the device further includes an analog switch.

    Abstract translation: 提供了一种太阳能光强测量装置,其包括一个或多个光伏电池,一个或多个电阻器和一个或多个发光二极管。 一个或多个光伏电池将光转换成电,该输出对应于入射光的强度。 从光伏电池电激活,通过一个或多个电阻器,发光二极管发射信号颜色,进一步对应于它们的电激活,并因此发射入射到一个或多个光伏电池上的光的强度。 将信号颜色与参考颜色或图表进行比较,以用于确定相关的光强度。 在一个实施例中,该设备还包括模拟开关。

    Method and apparatus for determining a vertical intensity profile through a plane of focus in a confocal microscope
    6.
    发明申请
    Method and apparatus for determining a vertical intensity profile through a plane of focus in a confocal microscope 失效
    用于通过共焦显微镜中的焦点平面确定垂直强度分布的方法和装置

    公开(公告)号:US20060055914A1

    公开(公告)日:2006-03-16

    申请号:US11224621

    申请日:2005-09-12

    Abstract: An assembly is provided for the direct measurement of a vertical intensity profile through a plane of focus of a confocal microscope, a determination of a depth of the confocal plane and a maximum intensity of the intensity profile. The assembly includes a transparent substrate in which is embedded a scale having a graduated length, wherein the scale is inclined relative to a local portion of an illuminating beam on an illuminating path of the confocal microscope. The graduated scale is configured to be illuminated with an intensity corresponding to the position within the plane of focus along the axis of the illuminating beam. The inclination of the scale and the path of the illuminating beam are at a predetermined angle. The graduated scale can be fluorescently dyed to illuminate with an absorption frequency relevant to a light source or illuminating beam of the confocal microscope. An algorithm employing trigonometric functions and calculating the confocal plane depth of the specimen is disclosed.

    Abstract translation: 提供了用于直接测量共聚焦显微镜的焦点平面的垂直强度分布,共焦面深度的确定和强度分布的最大强度的组件。 组件包括透明衬底,其中镶嵌有具有刻度长度的刻度,其中刻度尺相对于共焦显微镜的照明路径上的照明光束的局部部分倾斜。 刻度刻度被配置成以与照明光束的轴线上的焦点平面内的位置相对应的强度照亮。 照明光束的刻度和路径的倾斜度处于预定角度。 刻度刻度可以荧光染色,以与共聚焦显微镜的光源或照明光束相关的吸收频率照亮。 公开了一种使用三角函数并计算样本的共焦平面深度的算法。

    APPARATUSES, COMPONENTS AND METHODOLOGIES FOR DETERMINING SUITABILITY CONDITIONS FOR PLANT GROWTH
    7.
    发明申请
    APPARATUSES, COMPONENTS AND METHODOLOGIES FOR DETERMINING SUITABILITY CONDITIONS FOR PLANT GROWTH 失效
    用于确定植物生长适用性条件的装置,组件和方法

    公开(公告)号:US20080258078A1

    公开(公告)日:2008-10-23

    申请号:US12105782

    申请日:2008-04-18

    CPC classification number: G01J1/50 A01G7/00 G01J1/38

    Abstract: Mechanisms are provided to easily determining an indication of the amount of light available at a growing location over a given period of time. Such mechanisms may be used indoors or outdoors and are designed so as to provide an easily readable and understandable indication of the amount of light available at a growing location either empirically or with reference to a reference color chart.

    Abstract translation: 提供了用于容易地确定在给定时间段内在生长位置可用的光量的指示的机制。 这样的机构可以在室内或室外使用,并且被设计成以经验或参考参考色彩图提供在生长地点可用的光量的容易读出和可理解的指示。

    Method and apparatus for determining a vertical intensity profile through a plane of focus in a confocal microscope
    8.
    发明授权
    Method and apparatus for determining a vertical intensity profile through a plane of focus in a confocal microscope 失效
    用于通过共焦显微镜中的焦点平面确定垂直强度分布的方法和装置

    公开(公告)号:US07239379B2

    公开(公告)日:2007-07-03

    申请号:US11224621

    申请日:2005-09-12

    Abstract: An assembly is provided for the direct measurement of a vertical intensity profile through a plane of focus of a confocal microscope, a determination of a depth of the confocal plane and a maximum intensity of the intensity profile. The assembly includes a transparent substrate in which is embedded a scale having a graduated length, wherein the scale is inclined relative to a local portion of an illuminating beam on an illuminating path of the confocal microscope. The graduated scale is configured to be illuminated with an intensity corresponding to the position within the plane of focus along the axis of the illuminating beam. The inclination of the scale and the path of the illuminating beam are at a predetermined angle. The graduated scale can be fluorescently dyed to illuminate with an absorption frequency relevant to a light source or illuminating beam of the confocal microscope. An algorithm employing trigonometric functions and calculating the confocal plane depth of the specimen is disclosed.

    Abstract translation: 提供了用于直接测量共聚焦显微镜的焦点平面的垂直强度分布,共焦面深度的确定和强度分布的最大强度的组件。 组件包括透明衬底,其中镶嵌有具有刻度长度的刻度,其中刻度尺相对于共焦显微镜的照明路径上的照明光束的局部部分倾斜。 刻度刻度被配置成以与照明光束的轴线上的焦点平面内的位置相对应的强度照亮。 照明光束的刻度和路径的倾斜度处于预定角度。 刻度刻度可以荧光染色,以与共聚焦显微镜的光源或照明光束相关的吸收频率照亮。 公开了一种使用三角函数并计算样本的共焦平面深度的算法。

    Quantity-of-light unevenness inspection apparatus, and quantity-of-light unevenness inspection method
    9.
    发明申请
    Quantity-of-light unevenness inspection apparatus, and quantity-of-light unevenness inspection method 审中-公开
    光量不均匀检查装置和光量不均匀性检查方法

    公开(公告)号:US20040026637A9

    公开(公告)日:2004-02-12

    申请号:US10087060

    申请日:2002-02-27

    Abstract: In the present invention, an image print mask 12H is photographed from a side across a light source 13 when the image print mask 12H for adjusting light so that a film is irradiated with the light is irradiated with the light, a luminance signal of the image print mask 12H is detected based on the photographed image on the image print mask 12H to create a luminance level waveform pattern 113A or 113B according to the luminance signal, and the luminance level waveform pattern 113A or 113B is displayed as the quantity-of-light unevenness of the light with which the image print mask 12H is irradiated, so that the luminance level waveform pattern 113A or 113Ba can make the user visually recognize the state of quantity-of-light unevenness of the light with which the image print mask 12H is irradiated.

    Abstract translation: 在本发明中,当用光照射光的调整光的图像打印掩模12H照射光时,从光源13的一侧拍摄图像打印掩模12H,图像的亮度信号 基于图像打印掩模12H上的拍摄图像检测打印掩码12H,以根据亮度信号创建亮度级波形图案113A或113B,并且亮度级波形图案113A或113B被显示为光量 图像打印掩模12H照射的光的不均匀性,使得亮度级波形图案113A或113Ba可以使用户可以视觉地识别图像打印掩码12H为止的光的光量不均匀的状态 照射。

    Electronic infrared detector
    10.
    发明授权
    Electronic infrared detector 失效
    电子红外探测器

    公开(公告)号:US4945244A

    公开(公告)日:1990-07-31

    申请号:US289327

    申请日:1988-12-23

    CPC classification number: G01J1/38

    Abstract: An infrared sensing device is capable of sensing the amount of infrared radiation which is present at a given location and presenting a visual indicia of the strength of the signal. A series of led's which light up in a bar graph fashion indicate the strength of the signal. The device also has a remote sensor which allows the sensing to be done at a location away from the position of the visual signal strength indicator.

    Abstract translation: 红外感测装置能够感测存在于给定位置处的红外辐射的量并且呈现信号强度的视觉标记。 一系列led以条形图表示的LED表示信号的强度。 该装置还具有远程传感器,其允许在远离视觉信号强度指示器的位置的位置处进行感测。

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