Invention Grant
- Patent Title: Methods and apparatus for determining, using, and indicating ion beam working properties
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Application No.: US14882297Application Date: 2015-10-13
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Publication No.: US11004656B2Publication Date: 2021-05-11
- Inventor: John Andrew Hunt , Steven Thomas Coyle , Michael Patrick Hassel-Shearer , Thijs C Hosman
- Applicant: Gatan, Inc.
- Applicant Address: US CA Pleasanton
- Assignee: Gatan, Inc.
- Current Assignee: Gatan, Inc.
- Current Assignee Address: US CA Pleasanton
- Agency: Snyder, Clark, Lesch & Chung, LLP
- Main IPC: H01J37/304
- IPC: H01J37/304 ; H01J37/30 ; H01J37/08 ; H01J37/24 ; H01J37/305 ; G01N1/44 ; H01J37/317

Abstract:
Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.
Public/Granted literature
- US20160111249A1 Methods and Apparatus for Determining, Using, and Indicating Ion Beam Working Properties Public/Granted day:2016-04-21
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