Invention Grant
- Patent Title: Method and apparatus for x-ray scattering material analysis
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Application No.: US17054457Application Date: 2019-05-15
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Publication No.: US11275038B2Publication Date: 2022-03-15
- Inventor: Peter Hoghoj , Blandine Lantz , Karsten Joensen , Soren Skou
- Applicant: XENOCS SAS
- Applicant Address: FR Grenoble
- Assignee: XENOCS SAS
- Current Assignee: XENOCS SAS
- Current Assignee Address: FR Grenoble
- Agency: Notaro, Michalos & Zaccaria P.C.
- Priority: EP18290051 20180515
- International Application: PCT/EP2019/062453 WO 20190515
- International Announcement: WO2019/219737 WO 20191121
- Main IPC: G01N23/201
- IPC: G01N23/201 ; G01N23/207
Abstract:
A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.
Public/Granted literature
- US20210364454A1 METHOD AND APPARATUS FOR X-RAY SCATTERING MATERIAL ANALYSIS Public/Granted day:2021-11-25
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