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公开(公告)号：US11275038B2
公开(公告)日：2022-03-15
申请号：US17054457
申请日：2019-05-15
Applicant: XENOCS SAS
Inventor： Peter Hoghoj , Blandine Lantz , Karsten Joensen , Soren Skou
IPC: G01N23/201 , G01N23/207
Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.
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