Invention Grant
- Patent Title: Technologies for high resolution and wide swath spectrometer
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Application No.: US17069020Application Date: 2020-10-13
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Publication No.: US11307097B1Publication Date: 2022-04-19
- Inventor: Florent M. Prel , Frederic J. Grandmont , Louis M. Moreau , Eric A. Carbonneau , Martin C. Larouche
- Applicant: ABB Schweiz AG
- Applicant Address: CH Baden
- Assignee: ABB Schweiz AG
- Current Assignee: ABB Schweiz AG
- Current Assignee Address: CH Baden
- Agency: Armstrong Teasdale LLP
- Main IPC: G01J3/453
- IPC: G01J3/453 ; G01J3/28 ; G01J3/45
Abstract:
Technologies for a high resolution and wide swath spectrometer are disclosed. In the illustrative embodiment, an inverted image slicer converts a linear field of view into a grid shape, allowing for an interferometer of a Fourier transform spectrometer to operate on a narrow range of field of views, improving the average spectral resolution of the spectrometer.
Public/Granted literature
- US20220113192A1 TECHNOLOGIES FOR HIGH RESOLUTION AND WIDE SWATH SPECTROMETER Public/Granted day:2022-04-14
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