Invention Grant
- Patent Title: System, method, and apparatus for rapid development of an inspection scheme for an inspection robot
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Application No.: US16863594Application Date: 2020-04-30
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Publication No.: US11472031B2Publication Date: 2022-10-18
- Inventor: Edward A. Bryner , Kevin Y. Low , Joshua D. Moore , Dillon R. Jourde , Francesco H. Trogu , Jeffrey J. Mrkonich , William J. Pridgen , Domenic P. Rodriguez , Alexander C. Watt , Michael Stephen Auda , Logan A. MacKenzie , Ian Miller , Samuel Theodore Westenberg , Katherine Virginia Denner , Benjamin A. Guise , Yizhu Gu , Todd Joslin , Mark J. Loosararian , Mark Cho , Edwin H. Cho
- Applicant: Gecko Robotics, Inc.
- Applicant Address: US PA Pittsburgh
- Assignee: Gecko Robotics, Inc.
- Current Assignee: Gecko Robotics, Inc.
- Current Assignee Address: US PA Pittsburgh
- Agency: GTC Law Group PC & Affiliates
- Main IPC: B25J9/16
- IPC: B25J9/16 ; B25J9/00 ; B25J5/00 ; G05D1/00 ; G05D1/02 ; B25J9/10 ; B25J19/00 ; B25J19/02 ; G01B11/06 ; G01B11/24 ; G01B11/30 ; G01B17/02 ; G01B17/06 ; G01B17/08 ; G01J3/50 ; G01K13/00 ; B25J13/08
Abstract:
Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.
Public/Granted literature
- US11511426B2 System, method, and apparatus for rapid development of an inspection scheme for an inspection robot Public/Granted day:2022-11-29
Information query
IPC分类:
