Invention Grant
- Patent Title: Deep learning based identification of difficult to test nodes
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Application No.: US17231866Application Date: 2021-04-15
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Publication No.: US11574097B2Publication Date: 2023-02-07
- Inventor: Harbinder Sikka , Kaushik Narayanun , Lijuan Luo , Karthikeyan Natarajan , Manjunatha Gowda , Sandeep Gangundi
- Applicant: NVIDIA Corp.
- Applicant Address: US CA Santa Clara
- Assignee: NVIDIA Corp.
- Current Assignee: NVIDIA Corp.
- Current Assignee Address: US CA Santa Clara
- Agency: Rowan TELS LLC
- Main IPC: G06F7/50
- IPC: G06F7/50 ; G06F30/327 ; G06N3/08 ; G06N7/00 ; G06K9/62 ; G06N3/04
Abstract:
Techniques to improve the accuracy and speed for detection and remediation of difficult to test nodes in a circuit design netlist. The techniques utilize improved netlist representations, test point insertion, and trained neural networks.
Public/Granted literature
- US20210295169A1 DEEP LEARNING BASED IDENTIFICATION OF DIFFICULT TO TEST NODES Public/Granted day:2021-09-23
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