Invention Grant
- Patent Title: Temperature-based assymetry correction during CMP and nozzle for media dispensing
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Application No.: US16849912Application Date: 2020-04-15
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Publication No.: US11697187B2Publication Date: 2023-07-11
- Inventor: Haosheng Wu , Shou-Sung Chang , Jianshe Tang , Chih Chung , Hui Chen , Hari Soundararajan , Benjamin Cherian
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Fish & Richardson P.C.
- Main IPC: B24B1/00
- IPC: B24B1/00 ; B24B57/02 ; H01L21/304 ; B24B37/04 ; B24B37/015 ; B24B37/10 ; B24B37/22 ; B24B37/34 ; B24B55/02 ; B24B53/017 ; B24B49/14

Abstract:
A chemical mechanical polishing apparatus includes a rotatable platen to hold a polishing pad, a rotatable carrier to hold a substrate against a polishing surface of the polishing pad during a polishing process, a polishing liquid supply port to supply a polishing liquid to the polishing surface, a thermal control system including a movable nozzle to spray a medium onto the polishing surface to adjust a temperature of a zone on the polishing surface, an actuator to move the nozzle radially relative to an axis of rotation of the platen, and a controller configured to coordinate dispensing of the medium from the nozzle with motion of the nozzle across the polishing surface.
Public/Granted literature
- US20200331117A1 TEMPERATURE-BASED ASSYMETRY CORRECTION DURING CMP AND NOZZLE FOR MEDIA DISPENSING Public/Granted day:2020-10-22
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