Invention Grant
- Patent Title: Charged particle beam apparatus
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Application No.: US17394925Application Date: 2021-08-05
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Publication No.: US11749497B2Publication Date: 2023-09-05
- Inventor: Shunsuke Mizutani , Shahedul Hoque , Uki Ikeda , Makoto Suzuki
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- The original application number of the division: US16482765
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/147 ; H01J37/244

Abstract:
A charged particle beam apparatus covering a wide range of detection angles of charged particles emitted from a sample includes an objective lens for converging charged particle beams emitted from a charged particle source and a detector for detecting charged particles emitted from a sample. The objective lens includes inner and outer magnetic paths which are formed so as to enclose a coil. A first inner magnetic path is disposed at a position opposite to an optical axis of the charged particle beams. A second inner magnetic path, formed at a slant with respect to the optical axis of the charged particle beams, includes a leading end. A detection surface of the detector is disposed at the outer side from a virtual straight line that passes through the leading end and that is parallel to the optical axis of the charged particle beams.
Public/Granted literature
- US20210375583A1 Charged Particle Beam Apparatus Public/Granted day:2021-12-02
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