Invention Grant
- Patent Title: Charged particle beam apparatus
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Application No.: US17570043Application Date: 2022-01-06
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Publication No.: US11776787B2Publication Date: 2023-10-03
- Inventor: Kazuki Yagi , Yusuke Toriumi
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: THE WEBB LAW FIRM
- Priority: JP 21001502 2021.01.07
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/20 ; H01J37/244 ; H01J37/26

Abstract:
A charged particle beam apparatus includes a tilt mechanism that tilts a specimen, a detector that detects an electromagnetic wave emitted from the specimen, a table storage unit that stores a table in which tilt angle information on a tilt angle of the specimen and detection solid-angle information on the detection solid angle of the detector are associated with each other, a tilt control unit that controls the tilt mechanism, and a detection-solid-angle information acquisition unit that acquires the tilt angle information from the tilt control unit and acquires the detection solid-angle information with reference to the table.
Public/Granted literature
- US20220216033A1 Charged Particle Beam Apparatus Public/Granted day:2022-07-07
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