Invention Grant
- Patent Title: Spectroscopic analysis device, optical system, and method
-
Application No.: US17406653Application Date: 2021-08-19
-
Publication No.: US11940326B2Publication Date: 2024-03-26
- Inventor: Kodai Murayama , Toshiyuki Saruya , Fumie Watanabe , Risa Hara
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha Bergman Watanabe & Burton LLP
- Priority: JP 20142851 2020.08.26
- Main IPC: G01J3/42
- IPC: G01J3/42 ; G01J3/02 ; G01N21/31 ; G01N21/359

Abstract:
A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.
Public/Granted literature
- US20220065697A1 SPECTROSCOPIC ANALYSIS DEVICE, OPTICAL SYSTEM, AND METHOD Public/Granted day:2022-03-03
Information query