公开(公告)号：US11940326B2

公开(公告)日：2024-03-26

申请号：US17406653

申请日：2021-08-19

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Kodai Murayama ,  Toshiyuki Saruya ,  Fumie Watanabe ,  Risa Hara

IPC: G01J3/42 ,  G01J3/02 ,  G01N21/31 ,  G01N21/359

CPC classification number: G01J3/42 ,  G01J3/0218 ,  G01N21/359 ,  G01N2021/3155

Abstract: A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

公开(公告)号：US11181469B2

公开(公告)日：2021-11-23

申请号：US16770219

申请日：2018-11-29

Applicant: Yokogawa Electric Corporation

Inventor： Kodai Murayama ,  Atsushi Ito ,  Fumie Watanabe

IPC: G01N21/19 ,  G01J3/28 ,  G01J3/447

Abstract: A spectroscopic analysis device includes a light source configured to emit light including a plurality of wavelength components, a polarizer configured to convert the light emitted from the light source to a light of linearly polarized light to be radiated to a sample, a polarizing diffraction element configured to diffract and spectrally disperse a first polarization component included in the light having passed through the sample in a first direction, the polarizing diffraction element being configured to diffract and spectrally disperse a second polarization component included in the light in a second direction different from the first direction, a prism which is disposed on an exit side of the polarizing diffraction element and which has a first exit surface crossing the first direction and a second exit surface crossing the second direction, and in which angles of the first exit surface and the second exit surface with respect to a reference plane including the first direction and the second direction are different, an imaging element configured to capture an image of the first polarization component emitted from the first exit surface of the prism and an image of the second polarization component emitted from the second exit surface, and a processor configured to analyze the sample based on an imaging result of the imaging element.

公开(公告)号：US12050128B2

公开(公告)日：2024-07-30

申请号：US17755550

申请日：2020-10-20

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Kodai Murayama ,  Toshiyuki Saruya ,  Fumie Watanabe ,  Risa Hara

IPC: G01J3/10 ,  G01J3/02 ,  G01N21/65 ,  G01J3/28

CPC classification number: G01J3/108 ,  G01J3/0294 ,  G01N21/658 ,  G01J3/28 ,  G01J2003/2879

Abstract: A spectroscopic analysis device (1) according to the present disclosure includes a controller (40) that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L1) irradiated by an irradiator (10) with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.

公开(公告)号：US20220065697A1

公开(公告)日：2022-03-03

申请号：US17406653

申请日：2021-08-19

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Kodai Murayama ,  Toshiyuki Saruya ,  Fumie Watanabe ,  Risa Hara

IPC: G01J3/42 ,  G01J3/02 ,  G01N21/359

Abstract: A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

公开(公告)号：US11821835B2

公开(公告)日：2023-11-21

申请号：US17218961

申请日：2021-03-31

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Risa Hara ,  Toshiyuki Saruya ,  Kodai Murayama ,  Fumie Watanabe

IPC: G01N21/31 ,  G01N21/25

CPC classification number: G01N21/3103 ,  G01N2021/258

Abstract: A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

公开(公告)号：US20210302306A1

公开(公告)日：2021-09-30

申请号：US17218961

申请日：2021-03-31

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Risa Hara ,  Toshiyuki Saruya ,  Kodai Murayama ,  Fumie Watanabe

IPC: G01N21/31

Abstract: A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

公开(公告)号：US11105737B2

公开(公告)日：2021-08-31

申请号：US16762772

申请日：2018-10-24

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Kodai Murayama ,  Hiroyuki Sugino ,  Fumie Watanabe ,  Atsushi Ito

IPC: G01N21/35 ,  G02B5/04

Abstract: A spectroscopic analysis device includes: a light source configured to emit light for irradiating a specimen; a prism stuck to the specimen and configured to totally reflect the light emitted from the light source; a polarizing separation element configured to separate the light totally reflected by the prism into a first and second polarized light components that are orthogonal to each other; a wavelength dispersing element configured to disperse respective wavelength components of the first and second polarized light components that are separated by the polarizing separation element; an image capturing element configured to capture respective images of the first and second polarized light components that are dispersed by the wavelength dispersing element; and a processing unit configured to perform component analysis on the specimen by obtaining an absorbency at each wavelength by using an imaging signal output from the image capturing element.