Invention Grant
US09035550B2 Method of axial alignment of charged particle beam and charged particle beam system
有权
带电粒子束和带电粒子束系统的轴向对准方法
- Patent Title: Method of axial alignment of charged particle beam and charged particle beam system
- Patent Title (中): 带电粒子束和带电粒子束系统的轴向对准方法
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Application No.: US13904098Application Date: 2013-05-29
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Publication No.: US09035550B2Publication Date: 2015-05-19
- Inventor: Mitsuru Yamada
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2012-124396 20120531
- Main IPC: H01J29/64
- IPC: H01J29/64 ; H01J37/147 ; H01J37/153 ; H01J37/28

Abstract:
A method of axially aligning a charged particle beam implemented by a charged particle beam system equipped with an astigmatic correction lens including a first pair of coils and a second pair of coils. The method starts with obtaining first to sixth sets of image data while varying currents flowing through the first to fourth coils according to first to sixth sets of conditions. Then, the values of the currents through the first to fourth coils for correcting the position of the axis of the beam are calculated based on the first to sixth sets of image data.
Public/Granted literature
- US20130320846A1 Method of Axial Alignment of Charged Particle Beam and Charged Particle Beam System Public/Granted day:2013-12-05
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