Invention Grant
- Patent Title: Imaging spectrometer with extended resolution
- Patent Title (中): 成像光谱仪具有更高的分辨率
-
Application No.: US14312740Application Date: 2014-06-24
-
Publication No.: US09279724B2Publication Date: 2016-03-08
- Inventor: Ian S. Robinson , John D. Bloomer , Bradley Flanders
- Applicant: RAYTHEON COMPANY
- Applicant Address: US MA Waltham
- Assignee: RAYTHEON COMPANY
- Current Assignee: RAYTHEON COMPANY
- Current Assignee Address: US MA Waltham
- Agency: Lando & Anastasi, LLP
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01J3/453 ; G01J3/02 ; G01J3/06

Abstract:
Interferometric transform spectrometer (ITS) systems and methods of operation thereof. In one example, an ITS system includes a Michelson interferometer that introduces a varying optical path length difference (OPD) between its two arms so as to produce an interferogram, a detector that receives and samples the interferogram, and a scan controller coupled to the detector and to Michelson interferometer. The scan controller controls the Michelson interferometer to vary the OPD in discrete steps such that the detector provides M samples of the interferogram for each of two scan segments. In the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value. In the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value.
Public/Granted literature
- US20150369667A1 IMAGING SPECTROMETER WITH EXTENDED RESOLUTION Public/Granted day:2015-12-24
Information query