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公开(公告)号：JP2005043892A
公开(公告)日：2005-02-17
申请号：JP2004215355
申请日：2004-07-23
Inventor： RIEDMANN JUERGEN
IPC: G02B21/00
CPC classification number: G02B21/0032 , G02B21/0052
Abstract: PROBLEM TO BE SOLVED: To provide a raster (scan) microscope the detection efficiency of which hardly depends on the scan speed.
SOLUTION: This is a confocal raster (scan) microscope which scans objects being detected having an illumination beam path including at least one point light source and a beam deflection device, and a detection beam path including at least one detection (pin) hole diaphram and the beam deflection device. The path of the illumination beam path and/or the detection beam path is constituted applicable to the scanning speed.
COPYRIGHT: (C)2005,JPO&NCIPIAbstract translation: 要解决的问题：提供一种光栅（扫描）显微镜，其检测效率几乎不依赖于扫描速度。 解决方案：这是共焦光栅（扫描）显微镜，其扫描具有包括至少一个点光源和光束偏转装置的照明光束路径的物体，以及检测光束路径，其包括至少一个检测（引脚） 孔梁和梁偏转装置。 照射光束路径和/或检测光束路径的路径适用于扫描速度。 版权所有（C）2005，JPO＆NCIPI
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公开(公告)号：JP2006221180A
公开(公告)日：2006-08-24
申请号：JP2006033663
申请日：2006-02-10
Inventor： RIEDMANN JUERGEN
CPC classification number: G02B21/0024 , G02B7/04 , G02B27/09
Abstract: PROBLEM TO BE SOLVED: To provide a device for setting the divergence and/or convergence of a light beam with which the divergence and/or convergence can be set quickly.
SOLUTION: The device for setting the divergence and/or convergence of a light beam (1), particularly in a scanning microscope, includes at least one optical component (2) that sets the divergence and/or convergence of the light beam (1), and includes a positioning device (3) for the component (2). The positioning device (3)includes at least one piezoelectric element (4).
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：提供一种用于设定可以快速设定发散和/或收敛的光束的发散和/或会聚的装置。 解决方案：用于设置光束（1）的发散和/或会聚的装置，特别是在扫描显微镜中，包括设置光束的发散和/或会聚的至少一个光学部件（2） （1），并且包括用于部件（2）的定位装置（3）。 定位装置（3）包括至少一个压电元件（4）。 版权所有（C）2006，JPO＆NCIPI
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3.发明专利Method and device for detecting dark state in spectroscopic or microscopic inspection for fluorescent sample 有权用于检测荧光样品的光谱或微观检查中的深色状态的方法和装置
公开(公告)号：JP2006234815A
公开(公告)日：2006-09-07
申请号：JP2006043884
申请日：2006-02-21
Inventor： RIEDMANN JUERGEN , KNEBEL WERNER , KUSCHEL LIOBA
IPC: G01N21/64
CPC classification number: G01N21/6428 , G01N21/6408 , G01N21/6458
Abstract: PROBLEM TO BE SOLVED: To univocally or clearly discriminate between a phenomenon to be observed and a necessarily occurring dark state, in spectroscopic or microscopic inspection for a fluorescent sample.
SOLUTION: This method is a detection method for a state in spectroscopic or microscopic inspection for a fluorescent processed samples, especially those having fluorescent colored protein (two or more). The method is characterized in that in at least two independent measurements, excitation/illumination volume of excited light, that is, distribution of intensity is changed; and when it is detected whether a time constant to be observed is changed, and if the time constant is not changed, the existence of dark state is concluded.
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：在荧光样品的光谱或显微镜检查中，要明确或清楚地区分待观察的现象和必然发生的暗态。 解决方案：该方法是用于荧光加工样品，特别是具有荧光着色蛋白质（两种或更多种）的荧光加工样品的光谱或显微镜检查状态的检测方法。 该方法的特征在于，在至少两次独立测量中，激发光的激发/照明体积，即强度分布发生变化; 并且当检测到是否改变要观察的时间常数时，如果时间常数不改变，则暗态的存在结束。 版权所有（C）2006，JPO＆NCIPI
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公开(公告)号：JP2006163402A
公开(公告)日：2006-06-22
申请号：JP2005350441
申请日：2005-12-05
Inventor： RIEDMANN JUERGEN
IPC: G02B21/06
CPC classification number: G02B27/16 , G02B21/0032 , G02B27/144
Abstract: PROBLEM TO BE SOLVED: To surely correct aberration by a constitutionally simple means even when using thick beam splitters in an optical arrangement for a microscope. SOLUTION: The optical arrangement for a microscope is equipped with the beam splitter (1) arranged in a divergent and/or convergent beam path for separating an illumination light (2) that is produced by an illumination source from a detection light (3) that is emitted by a sample being tested. The beam splitter (1) is wedge-shaped and implemented as a beam splitter plate for reflection primarily at a glass-air interface (4). COPYRIGHT: (C)2006,JPO&NCIPI
Abstract translation: 要解决的问题：即使在用于显微镜的光学装置中使用厚分束器时，也可以通过简单的方式来确实地校正像差。 解决方案：用于显微镜的光学装置配备有分布在发散和/或会聚光束路径中的分束器（1），用于将由照明源产生的照明光（2）从检测光 3）由被测样品发出的。 分束器（1）是楔形的并且被实现为用于主要在玻璃 - 空气界面（4）处反射的分束板。 版权所有（C）2006，JPO＆NCIPI
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公开(公告)号：DE102004052955B4
公开(公告)日：2014-02-13
申请号：DE102004052955
申请日：2004-10-29
Applicant: LEICA MICROSYSTEMS
Inventor： RIEDMANN JUERGEN , LEIMBACH VOLKER
IPC: G02B21/06
Abstract: Optische Anordnung, insbesondere Scanmikroskop, mit einem Laser (1), vorzugsweise Kurzpulslaser, und einer in dem vom Laser (1) ausgehenden Strahlengang angeordneten Einrichtung (2) zur Korrektur von chromatischen Fehlern, wobei die Einrichtung (2) zur Korrektur von chromatischen Fehlern einen Pulsestretcher (3) aufweist, dadurch gekennzeichnet, dass der Pulsestretcher (3) in ein Strahlaufweitungssystem (4) der optischen Anordnung integriert ist.
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Patent Agency Ranking
公开(公告)号：DE102004054262A1
公开(公告)日：2006-05-11
申请号：DE102004054262
申请日：2004-11-09
Applicant: LEICA MICROSYSTEMS
Inventor： RIEDMANN JUERGEN , BOEHM INGO , LEIMBACH VOLKER , ULRICH HEINRICH , BIRK HOLGER
IPC: G02B21/00
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公开(公告)号：DE102004052955A1
公开(公告)日：2006-05-04
申请号：DE102004052955
申请日：2004-10-29
Applicant: LEICA MICROSYSTEMS
Inventor： RIEDMANN JUERGEN , LEIMBACH VOLKER
IPC: G02B21/06
Abstract: The arrangement has a laser to emit a beam, and a chromatic error correcting device disposed in a beam path that is emitted by the laser, where the device includes a pulse stretcher (3). The stretcher is arranged in an area of a beam expansion system (4) of the arrangement, and integrated into the system. The system includes positive achromates, each having a respective different focal length.
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公开(公告)号：DE10333445A1
公开(公告)日：2005-02-10
申请号：DE10333445
申请日：2003-07-23
Applicant: LEICA MICROSYSTEMS
Inventor： RIEDMANN JUERGEN
Abstract: A confocal scanning microscope for scanning a sample has an illumination beam path that encompasses at least one point light source and a beam deflection device, and has further a detection beam path that encompasses at least one detection pinhole and the beam deflection device. The routing of the illumination beam path and/or of the detection beam path is adaptable to the scanning speed.
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公开(公告)号：DE102010037786A1
公开(公告)日：2012-03-29
申请号：DE102010037786
申请日：2010-09-27
Applicant: LEICA MICROSYSTEMS
Inventor： RIEDMANN JUERGEN
IPC: G02B21/00
Abstract: Ein Mikroskop (20) zum Untersuchen einer Probe (36) hat eine erste Beleuchtungslichtquelle (22), die als Laserlichtquelle ausgebildet ist und die zum Beleuchten der Probe (36) erstes Beleuchtungslicht (24) erzeugt. Eine Scaneinheit (28) lenkt das erste Beleuchtungslicht (24) so ab, dass das erste Beleuchtungslicht (24) die Probe (36) von einer ersten Seite aus optisch abtastet, wodurch von der Probe (36) entgegen gerichtet zu dem ersten Beleuchtungslicht (24) erstes Detektionslicht (38) ausgeht. Ein Hauptstrahlteiler (26) trennt das erste Beleuchtungslicht (24) von dem ersten Detektionslicht (38). Eine Detektionsblende (42, 52, 54) begrenzt eine laterale Ausdehnung des ersten Detektionslichts (38). Eine Detektoranordnung (44, 56) detektiert das lateral begrenzte erste Detektionslicht (38). Eine zweite Beleuchtungslichtquelle (50) erzeugt zweites Beleuchtungslicht (46) und beleuchtet die Probe (36) von einer zweiten Seite aus, wodurch von der Probe (36) entgegen gerichtet zu dem ersten Beleuchtungslicht (24) zweites Detektionslicht (51) ausgeht, wobei die Detektoranordnung (44, 56) das zweite Detektionslicht (51) detektiert.
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公开(公告)号：DE102005008196A1
公开(公告)日：2006-08-31
申请号：DE102005008196
申请日：2005-02-22
Applicant: LEICA MICROSYSTEMS
Inventor： RIEDMANN JUERGEN , KNEBEL WERNER , KUSCHEL LIOBA
IPC: G01N21/64
Abstract: A method for recognizing dark states during the spectroscopic or microscopic examination of fluorescent specimens includes varying an intensity distribution of excitation light by varying an excitation/illumination volume over a plurality of mutually independent measurements. A determination is made as to whether observed time constants change between the measurements. The existence of a dark state is inferred where the observed time constants are unchanged between the measurements.
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