Method and apparatus for imaging sample with scanning microscopy
    1.
    发明专利
    Method and apparatus for imaging sample with scanning microscopy 有权
    用扫描显微镜成像样品的方法和装置

    公开(公告)号:JP2012145939A

    公开(公告)日:2012-08-02

    申请号:JP2012001076

    申请日:2012-01-06

    CPC classification number: G02B21/008 G01N21/6458 G02B21/0076

    Abstract: PROBLEM TO BE SOLVED: To provide a method and an apparatus which image a sample with a scanning microscopy.SOLUTION: Disclosed are a method and an apparatus for imaging a sample (28) with a scanning microscopy. Multiple sample points are scanned with a scanning beam (14) in consecutive scanning time sections. An intensity of light emitted from each of the scanned sample points is sensed repeatedly within each of the related scanning time sections. Based on intensities sensed at each of the scanned sample points, an intensity average value is found as an average value image point signal. Then, by synthesizing such average value image point signals, an average value raster image signal is generated. Further, in addition, based on intensities sensed at each of the scanned sample points, an intensity variance value is found as a variance image point signal. Then, by synthesizing such variance image point signals, a variance raster image signal is generated.

    Abstract translation: 要解决的问题:提供一种用扫描显微镜对样品进行成像的方法和装置。 解决方案:公开了一种用扫描显微镜对样品(28)进行成像的方法和装置。 在连续扫描时间段内用扫描光束(14)扫描多个采样点。 在每个相关的扫描时间段内重复地感测从每个扫描的采样点发射的光的强度。 基于在每个扫描采样点处感测到的强度,发现强度平均值作为平均值图像点信号。 然后,通过合成这样的平均值图像点信号,生成平均值光栅图像信号。 此外,另外,基于在每个扫描采样点处感测到的强度,发现强度方差值作为方差图像点信号。 然后,通过合成这样的方差图像点信号,生成方差光栅图像信号。 版权所有(C)2012,JPO&INPIT

    Beam or ray deflector and scanning microscope
    2.
    发明专利
    Beam or ray deflector and scanning microscope 审中-公开
    光束或光束偏转器和扫描显微镜

    公开(公告)号:JP2006119643A

    公开(公告)日:2006-05-11

    申请号:JP2005301629

    申请日:2005-10-17

    CPC classification number: G02B21/0048 G02B7/1821

    Abstract: PROBLEM TO BE SOLVED: To provide a beam or ray deflector and a scanning microscope in which noise is reduced at least in a sound volume level.
    SOLUTION: In a beam or ray deflector equipped with at least one deflecting means that is movably arranged for the purpose of adjustably deflecting a beam or a ray, the movably arranged deflecting means (15) is positioned in a fully soundproof casing (17) equipped with a light incident window (19) and/or a light emitting window (23).
    COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:提供至少在音量水平下噪声降低的光束或射线偏转器和扫描显微镜。 解决方案:在装备有至少一个可移动地设置用于可调节地偏转光束或射线的目的的偏转装置的光束或射线偏转器中,可移动地布置的偏转装置(15)被定位在完全隔音的壳体 17)配备有光入射窗(19)和/或发光窗(23)。 版权所有(C)2006,JPO&NCIPI

    BEAM DEFLECTING DEVICE
    5.
    发明专利

    公开(公告)号:JP2001166245A

    公开(公告)日:2001-06-22

    申请号:JP2000356044

    申请日:2000-11-22

    Abstract: PROBLEM TO BE SOLVED: To provide a beam deflecting device which gives the possibility of flexible and diverse uses by actualizing the maximum changeability of a frequency range and the highest reachable vibration frequency. SOLUTION: This beam deflecting device deflects a light beam by a mirror device (4) which can be rotated alternately by a rotary driving mechanism (1), and the rotary driving mechanism (1) is equipped with 1st and 2nd driving devices (2, 3) which rotate the mirror device (4) on a rotary shaft (5) together or independently of each other and are independent of each other; and the 2nd driving device (3) is fitted to the shaft (6) of the 1st driving device (2) so that the 2nd driving device (3) can be rotated by the 1st driving device (2), and the mirror device (4) is fitted to the shaft (7) of the 2nd driving device (3).

    Device for attenuating sound on light beam path of microscope and microscope having corresponding device
    6.
    发明专利
    Device for attenuating sound on light beam path of microscope and microscope having corresponding device 有权
    用于在具有相应装置的显微镜和显微镜的光束路径上衰减声音的装置

    公开(公告)号:JP2013238856A

    公开(公告)日:2013-11-28

    申请号:JP2013101997

    申请日:2013-05-14

    Abstract: PROBLEM TO BE SOLVED: To provide a device for attenuating sound on a light beam path of a microscope and a microscope having a corresponding device.SOLUTION: The device for attenuating sound on a light beam path (1) of a microscope includes a sound-proof casing (casing) (2) for sealing a sound radiation component, preferentially, quickly moving or vibrating beam deflection means, especially, a resonant mirror (3), and the casing (2) includes at least one optical inlet/outlet opening (opening). The casing (2), preferentially, the opening of the casing is formed and/or constituted such that sound to be output from the casing (2) mostly disappears due to offset-like interference without affecting a light beam when this invention is not used. A microscope having the corresponding device is further claimed.

    Abstract translation: 要解决的问题:提供一种用于衰减显微镜的光束路径上的声音的装置和具有相应装置的显微镜。解决方案:用于衰减显微镜的光束路径(1)上的声音的装置包括: 优选地,快速移动或振动光束偏转装置,特别是共振反射镜(3),并且壳体(2)包括至少一个光学入口/出口(2),用于密封声辐射分量 开)。 壳体(2)优选地形成和/或构成使得当不使用本发明时,从壳体(2)输出的声音大体上由于偏移状干扰而不影响光束而消失 。 还要求具有相应装置的显微镜。

    Detection device
    7.
    发明专利
    Detection device 有权
    检测装置

    公开(公告)号:JP2013040940A

    公开(公告)日:2013-02-28

    申请号:JP2012180131

    申请日:2012-08-15

    CPC classification number: H01L31/024 H01J40/02 H01J40/16 H01J43/02 H01J43/28

    Abstract: PROBLEM TO BE SOLVED: To provide a detection device.SOLUTION: The detection device is embodied so as to receive light and generate an electric signal, and has a housing, a sensor arranged in the housing and a cooling element arranged in the housing. The cooling element electrically insulates the detector from the housing, or the cooling element is configured to be a part of an insulation body that electrically insulates the detector from the housing.

    Abstract translation: 要解决的问题:提供一种检测装置。 解决方案:检测装置被实施为接收光并产生电信号,并且具有壳体,布置在壳体中的传感器和布置在壳体中的冷却元件。 冷却元件将检测器与壳体电绝缘,或者冷却元件构造成绝缘体的一部分,该绝缘体将检测器与壳体电绝缘。 版权所有(C)2013,JPO&INPIT

    ALIGNMENT MATCHING METHOD OF MICROSCOPE AND MICROSCOPE HAVING ALIGNMENT MATCHING DEVICE OF LIGHT BEAM

    公开(公告)号:JP2002333580A

    公开(公告)日:2002-11-22

    申请号:JP2002067784

    申请日:2002-03-13

    Abstract: PROBLEM TO BE SOLVED: To provide a method capable of easily regulating a beam path within an optical system. SOLUTION: The light beam (1) of the microscope (15) is inputted and coupled to a regulating device (7) of the light beam (1) at a prescribed position and at this time the inputted and coupled light beam (9) is formed within the device (70). The inputted and coupled light beam (9) is deflected to at least two photodetectors (10 and 22). The photodetectors (10 and 22) respectively have the different distances from the prescribed positions and the deviation between the inputted and coupled light beam (9) and a target position (72) is detected from the electric signals of the photodetectors (10 and 20) and an optical component (76) is regulated to bring the inputted and coupled light beam (9) to the target position (72) across at least one regulating element (78).

    Device and method for detecting light
    9.
    发明专利
    Device and method for detecting light 审中-公开
    用于检测光的装置和方法

    公开(公告)号:JP2013020972A

    公开(公告)日:2013-01-31

    申请号:JP2012155433

    申请日:2012-07-11

    Abstract: PROBLEM TO BE SOLVED: To provide a device and method for detecting light.SOLUTION: A device for detecting light used especially for a microscope, spectrometer or camera includes at least one silicon photomultiplier (SiPM) having an array of a plurality of single-photon avalanche diodes (SPADs), the array being larger in area than incident light. The device is configured to activate and/or analyze only the SPADs upon which a specific minimum intensity of light impinges. A method of using this device is also provided.

    Abstract translation: 要解决的问题:提供一种用于检测光的装置和方法。 用于检测特别用于显微镜,光谱仪或相机的光的装置包括至少一个具有多个单光子雪崩二极管(SPAD)的阵列的硅光电倍增管(SiPM),该阵列的面积更大 比入射光。 该装置被配置为仅激活和/或分析特定的最小光强度所在的SPAD。 还提供了使用该装置的方法。 版权所有(C)2013,JPO&INPIT

    Device and method for adjusting beam in optical beam path
    10.
    发明专利
    Device and method for adjusting beam in optical beam path 审中-公开
    光束路径调整光束的装置和方法

    公开(公告)号:JP2008217013A

    公开(公告)日:2008-09-18

    申请号:JP2008053442

    申请日:2008-03-04

    CPC classification number: G02B21/06

    Abstract: PROBLEM TO BE SOLVED: To provide a device and method for adjusting a beam in an optical beam path.
    SOLUTION: The device for beam adjustment in optical beam paths having at least two mutually independent light sources (1 and 2), preferably, in beam paths (8 and 9) of a high resolution or super high resolution microscope requires superposition of beams of light sources (1 and 2) in a common illuminating beam path (10), and a calibration sample (22) assisting in checking pupil positions and/or focus positions of the beams is put in the illuminating beam path (10) and can be taken out of it.
    COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种用于调整光束路径中的光束的装置和方法。 解决方案:用于具有至少两个相互独立的光源(1和2)的光束路径中的光束调节装置优选地在高分辨率或超高分辨率显微镜的光束路径(8和9)中需要叠加 在公共照明光路(10)中的光源(1和2)光束和辅助检查光束的光瞳位置和/或聚焦位置的校准样品(22)被放入照明光束路径(10)和 可以从中取出。 版权所有(C)2008,JPO&INPIT

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