Abstract:
PROBLEM TO BE SOLVED: To provide a method and an apparatus which image a sample with a scanning microscopy.SOLUTION: Disclosed are a method and an apparatus for imaging a sample (28) with a scanning microscopy. Multiple sample points are scanned with a scanning beam (14) in consecutive scanning time sections. An intensity of light emitted from each of the scanned sample points is sensed repeatedly within each of the related scanning time sections. Based on intensities sensed at each of the scanned sample points, an intensity average value is found as an average value image point signal. Then, by synthesizing such average value image point signals, an average value raster image signal is generated. Further, in addition, based on intensities sensed at each of the scanned sample points, an intensity variance value is found as a variance image point signal. Then, by synthesizing such variance image point signals, a variance raster image signal is generated.
Abstract:
PROBLEM TO BE SOLVED: To provide a beam or ray deflector and a scanning microscope in which noise is reduced at least in a sound volume level. SOLUTION: In a beam or ray deflector equipped with at least one deflecting means that is movably arranged for the purpose of adjustably deflecting a beam or a ray, the movably arranged deflecting means (15) is positioned in a fully soundproof casing (17) equipped with a light incident window (19) and/or a light emitting window (23). COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a scanning microscope which is universally usable, provides the advantages of various known scanning microscopes, does not require a position adjusting cost or reduces the position adjusting cost and can be post installed. SOLUTION: An exchangeable module (66) which separates an irradiation optical path and a detecting optical path so as to form a specific angle with each other and has at least one acousto-optic member (13) is arranged between the irradiation optical path and the detecting optical path. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a method capable of sufficiently suppressing adverse interference by shortening the coherence length of a laser beam. SOLUTION: The phase position of a light field in the method of irradiating an object with the light (2) of a laser beam source (3) is changed by a modulating means (4), by which the occurrence of the interference within an optical path is averted within presettable time intervals or the such interference is allowed to occur only within the non-detectable range.
Abstract:
PROBLEM TO BE SOLVED: To provide a beam deflecting device which gives the possibility of flexible and diverse uses by actualizing the maximum changeability of a frequency range and the highest reachable vibration frequency. SOLUTION: This beam deflecting device deflects a light beam by a mirror device (4) which can be rotated alternately by a rotary driving mechanism (1), and the rotary driving mechanism (1) is equipped with 1st and 2nd driving devices (2, 3) which rotate the mirror device (4) on a rotary shaft (5) together or independently of each other and are independent of each other; and the 2nd driving device (3) is fitted to the shaft (6) of the 1st driving device (2) so that the 2nd driving device (3) can be rotated by the 1st driving device (2), and the mirror device (4) is fitted to the shaft (7) of the 2nd driving device (3).
Abstract:
PROBLEM TO BE SOLVED: To provide a device for attenuating sound on a light beam path of a microscope and a microscope having a corresponding device.SOLUTION: The device for attenuating sound on a light beam path (1) of a microscope includes a sound-proof casing (casing) (2) for sealing a sound radiation component, preferentially, quickly moving or vibrating beam deflection means, especially, a resonant mirror (3), and the casing (2) includes at least one optical inlet/outlet opening (opening). The casing (2), preferentially, the opening of the casing is formed and/or constituted such that sound to be output from the casing (2) mostly disappears due to offset-like interference without affecting a light beam when this invention is not used. A microscope having the corresponding device is further claimed.
Abstract:
PROBLEM TO BE SOLVED: To provide a detection device.SOLUTION: The detection device is embodied so as to receive light and generate an electric signal, and has a housing, a sensor arranged in the housing and a cooling element arranged in the housing. The cooling element electrically insulates the detector from the housing, or the cooling element is configured to be a part of an insulation body that electrically insulates the detector from the housing.
Abstract:
PROBLEM TO BE SOLVED: To provide a method capable of easily regulating a beam path within an optical system. SOLUTION: The light beam (1) of the microscope (15) is inputted and coupled to a regulating device (7) of the light beam (1) at a prescribed position and at this time the inputted and coupled light beam (9) is formed within the device (70). The inputted and coupled light beam (9) is deflected to at least two photodetectors (10 and 22). The photodetectors (10 and 22) respectively have the different distances from the prescribed positions and the deviation between the inputted and coupled light beam (9) and a target position (72) is detected from the electric signals of the photodetectors (10 and 20) and an optical component (76) is regulated to bring the inputted and coupled light beam (9) to the target position (72) across at least one regulating element (78).
Abstract:
PROBLEM TO BE SOLVED: To provide a device and method for detecting light.SOLUTION: A device for detecting light used especially for a microscope, spectrometer or camera includes at least one silicon photomultiplier (SiPM) having an array of a plurality of single-photon avalanche diodes (SPADs), the array being larger in area than incident light. The device is configured to activate and/or analyze only the SPADs upon which a specific minimum intensity of light impinges. A method of using this device is also provided.
Abstract:
PROBLEM TO BE SOLVED: To provide a device and method for adjusting a beam in an optical beam path. SOLUTION: The device for beam adjustment in optical beam paths having at least two mutually independent light sources (1 and 2), preferably, in beam paths (8 and 9) of a high resolution or super high resolution microscope requires superposition of beams of light sources (1 and 2) in a common illuminating beam path (10), and a calibration sample (22) assisting in checking pupil positions and/or focus positions of the beams is put in the illuminating beam path (10) and can be taken out of it. COPYRIGHT: (C)2008,JPO&INPIT