公开(公告)号：DE102009021993A1

公开(公告)日：2010-12-02

申请号：DE102009021993

申请日：2009-05-19

Applicant: LEICA MICROSYSTEMS

Inventor： ULRICH HEINRICH ,  BOEHM INGO

IPC: G02B21/06

Abstract: Es wird ein Scanmikroskop (110) zur Erstellung eines Abbilds einer Probe (160) vorgeschlagen. Das Scanmikroskop (110) umfasst mindestens einer Laserquelle (114) zur Erzeugung mindestens eines Laserstrahls (130, 136; 154). Weiterhin umfasst das Scanmikroskop (110) mindestens eine Scanvorrichtung (116) zum Abrastern zumindest eines Teilbereichs der Probe (160) mit dem Laserstrahl (130, 136; 154). Der Laserstrahl (130, 136; 154) weist mindestens einen ersten Laserstrahl (130) mit mindestens einer ersten Emissionswellenlänge im ultravioletten Spektralbereich auf. Die Laserquelle (114) weist mindestens einen optisch gepumpeten Festkörperlaser, insbesondere mindestens einen optisch gepumpten Halbleiterlaser (129), zur Erzeugung des mindestens einen ersten Laserstrahls (130) auf.

公开(公告)号：DE10156506C1

公开(公告)日：2003-05-22

申请号：DE10156506

申请日：2001-11-16

Applicant: LEICA MICROSYSTEMS

Inventor： BOEHM INGO ,  SCHREIBER FRANK

IPC: G02B21/00

Abstract: A method for generating a multicolor image of a specimen with a microscope is disclosed. The method comprises the step of determining the spacing of the focal planes of a first illuminating light beam that has a first wavelength and of a second illuminating light beam that has a second wavelength; the step of scanning the specimen with the first illuminating light beam and generating a first partial image; the step of performing a relative displacement, by an amount equal to the spacing, between the specimen and the focal plane of the illuminating light beam of the second wavelength; the step of scanning the specimen with the second illuminating light beam and generating a second partial image; and the step of superimposing the first and second partial images to yield the multicolor image. Further more a microscope and a confocal scanning microscope are disclosed.

公开(公告)号：DE102009050340A1

公开(公告)日：2011-05-05

申请号：DE102009050340

申请日：2009-10-23

Applicant: LEICA MICROSYSTEMS

Inventor： FEHRER DIRK-OLIVER ,  BOEHM INGO

IPC: G02B26/10 ,  G02B21/06 ,  G02B26/08

Abstract: Eine Vorrichtung (20) zum Ablenken eines Lichtstrahls in zwei unterschiedliche Richtungen hat einen Spiegel (22), ein erstes und ein zweites Drehstellelement (24). Das erste Drehstellelement (24) dreht sich abhängig von einem ersten Stellsignal um eine erste Achse (54). Das zweite Drehstellelement (26) ist entlang der ersten Achse (54) gegenüber dem ersten Drehstellelement (24) angeordnet und dreht sich abhängig von einem zweiten Stellsignal um die erste Achse (54). Ein erstes Federelement (28) ist mit dem ersten Drehstellelement (24) und außerhalb der ersten Achse (54) in einem vorgegebenen Abstand zu dieser mit dem Spiegel (22) verbunden. Ein zweites Federelement (30) ist mit dem zweiten Drehstellelement (26) und dem Spiegel (22) verbunden.

公开(公告)号：DE10337345A1

公开(公告)日：2005-03-17

申请号：DE10337345

申请日：2003-08-12

Applicant: LEICA MICROSYSTEMS

Inventor： BOEHM INGO ,  LEIMBACH VOLKER

IPC: G01J3/04 ,  G01J3/36 ,  G02B21/00 ,  G01J3/02

Abstract: Device for simultaneously detecting a number of spectral regions of a light beam, especially for detection light (1) from a confocal microscope with an aperture plate (2) and an arrangement for dispersive splitting of the light as well as a detection arrangement for detecting different spectral regions of the light, whereby the detector arrangement has detectors at different distances from the detection plane to generate a defined color length error so that different wavelength ranges can be imaged with optimal resolution in different imaging planes.

公开(公告)号：DE10324478B3

公开(公告)日：2004-12-09

申请号：DE10324478

申请日：2003-05-30

Applicant: LEICA MICROSYSTEMS

Inventor： BOEHM INGO ,  SCHREIBER FRANK

IPC: G01J3/14 ,  G01J4/00 ,  G02B21/00 ,  G02B21/06 ,  G02B26/02

Abstract: An apparatus for ascertaining properties of a light beam, comprises a means for splitting a measured beam out from the light beam and comprises at least one detector that at least partially receives the measured beam. A polarization-influencing means is arranged in the beam path of the measured beam in order to enhance reliability and reproducibility.

公开(公告)号：DE102005059649A1

公开(公告)日：2007-06-21

申请号：DE102005059649

申请日：2005-12-14

Applicant: LEICA MICROSYSTEMS

Inventor： HAY WILLIAM C ,  GORSHOEFER ANDREAS ,  BOEHM INGO

IPC: G02B21/24 ,  G01J3/457

Abstract: An apparatus for mounting multiple lasers, including a mounting plate configured to receive multiple lasers and including a first side and a second side, wherein the first side and the second side are not coplanar; at least six leg portions, each including a support end; wherein at least three of the leg portions project away from the first side of the mounting plate and at least three of the leg portions project away from the second side of the mounting plate; and wherein the support ends of the leg portions projecting away from the first side are configured to support the mounting plate when the first side is facing in a generally downward direction, and the support ends of the leg portions projecting away from the second side are configured to support the mounting plate when the second side is facing in a generally downward direction.

公开(公告)号：DE102004054262A1

公开(公告)日：2006-05-11

申请号：DE102004054262

申请日：2004-11-09

Applicant: LEICA MICROSYSTEMS

Inventor： RIEDMANN JUERGEN ,  BOEHM INGO ,  LEIMBACH VOLKER ,  ULRICH HEINRICH ,  BIRK HOLGER

IPC: G02B21/00

公开(公告)号：DE10356826A1

公开(公告)日：2005-07-07

申请号：DE10356826

申请日：2003-12-05

Applicant: LEICA MICROSYSTEMS

Inventor： BOEHM INGO ,  KNEBEL WERNER ,  ULRICH HEINRICH

IPC: G02B21/00 ,  G02B21/06 ,  G02F1/11

Abstract: A scanning microscope includes at least one light source, an acousto-optical element, a beam deflection device and a beam guiding device. The at least one light source generates an illuminating light beam. The acousto-optical element spatially splits a sub-light beam from the illuminating light beam and adjusts an optical power of the illuminating light beam. The beam deflection device scans the illuminating light beam over or through a sample. The beam guiding device directs the sub-light beam onto the sample.

公开(公告)号：DE102004038321A1

公开(公告)日：2005-06-02

申请号：DE102004038321

申请日：2004-08-06

Applicant: LEICA MICROSYSTEMS

Inventor： BOEHM INGO ,  BIRK HOLGER ,  LEIMBACH VOLKER ,  SEIFERT ROLAND

IPC: G02B5/00 ,  G02B5/10

Abstract: A light trap (1) comprises a hollow element (3) for absorbing undesirable light, and a feed element (5) opening into the hollow element and guiding undesirable light into the hollow element. Each imaginary ray leading inward from the inner surface (7) of the hollow element intersects the inner surface of the hollow element and/or the inner surface (9) of the feed element. An independent claim is also included for a microscope, especially a scanning microscope or a confocal scanning microscope, comprising the above light trap.