Abstract:
The memory device (10) comprises a memory array (2) having an organisation of the type comprising global word lines (4) and local word lines (6), a global row decoder (8) addressing the global word lines (4), a local row decoder (12) addressing the local word lines (6), a global power supply stage (22) supplying the global row decoder (8), and a local power supply stage (24) supplying the local row decoder (12).
Abstract:
An electrically programmable memory ( 100 ) including: an array ( 105 ) of a plurality of memory cells ( 210 ) arranged accordingly to a NAND architecture, said memory cells grouped into a plurality of memory blocks (225_1 - 225 K) and each memory block including a plurality of memory pages; means for receiving (106,I/O,112,115) an address corresponding to a respective memory block; selecting means ( 120,125r,195,125r,130,155 ) for selecting the addressed memory block; and means for detecting (REG_1 - REG_K,135,145,147) a failure of the addressed memory block, wherein the means for detecting a failure includes: a plurality of registers (REG_1 - REG_K), each register corresponding to a respective memory block and storing an indication (AR, RED ADD) of the failure of the respective memory block; and means for reading ( 135,145,147 ) the register corresponding to the addressed memory block in response to the receiving of the address, and wherein the programmable memory further includes at least one redundant memory block ( RED_1 - RED_M ) of memory cells including a plurality of redundant memory pages, the selecting means selecting the at least one redundant memory block in place of the addressed memory block in response to the reading of the indication of the failure.