Abstract:
A non-volatile memory device is provided. The memory device includes a memory matrix (105; 605) comprising a plurality of memory cells (Mc), arranged according to a plurality of rows and a plurality of columns. The memory device further includes a plurality of word lines (WL(i)); each word line is associated with one respective row of said plurality and is connected to the memory cells of the row; the word lines are grouped into at least one packet (WLP). The memory device includes a row selector (160; 660) coupled to the word lines and adapted to selectively biasing them. The row selector includes, for each packet of word lines, a plurality of first paths, wherein each first path is adapted to apply a first biasing voltage to a corresponding word line of the packet depending on an operation to be performed on the memory cells connected to the corresponding word line. Each first path includes at least a first (N(i)) and a second (P(i)) selection transistors series-connected between a first terminal and a second terminal of the first path. The second terminal is coupled to the corresponding word line. The memory device further includes enabling means (110) for commonly providing an enabling voltage to the first terminal of the first paths associated to a selected packet of word lines including a selected word line. The enabling voltage depends on the operation to be performed on the memory cells connected to the selected word line and is adapted to enable the execution of said operation. The memory device further includes selection means (150) for selecting one among said plurality of first paths. the selected first path corresponding to the selected word line. The selection means are adapted to activate the first selection transistor of the selected first path in order to obtain the first biasing voltage from the enabling voltage by a voltage drop introduced by the first selection transistor; said selection means are further adapted to activate the second selection transistor of the selected first path in order to transfer the first biasing voltage provided by the first selection transistor onto the selected word line.
Abstract:
A circuit is disclosed. The circuit comprises a first input terminal (INA1), a second input terminal (INA2) and an output terminal (OUT). The circuit further includes a first circuital branch (610) connected between the first input terminal and the output terminal, and a second circuital branch (620) connected between the second input terminal and the output terminal. The first circuital branch is selectively activatable for coupling the first input terminal with the output terminal, and the second circuital branch is selectively activatable for coupling the second input terminal with the output terminal. The first and second circuital branches comprise each at least one electronic device having at least a first and a second device terminals. Said at least one electronic device is designed to guarantee the capability of sustaining voltage differences across at least the first and second device terminals thereof that are up-limited in absolute value by a first predetermined maximum value lower than the maximum of absolute values of voltage differences between the output terminal and the first input terminal, and between the output terminal and the second input terminal, respectively.
Abstract:
Boot method for a data control unit, wherein boot information is downloaded from a nonvolatile memory (22) into a temporary buffer (29) of a boot-activation unit (21); a processing unit (23) is activated by the boot-activation unit; a boot code is executed by the processing unit; and an operating code is downloaded from the nonvolatile memory (22) into a volatile memory (24) through the boot-activation unit. To correct possible errors in the block of the nonvolatile memory containing information and boot codes, the boot-activation unit (21) verifies whether the boot information downloaded into its volatile memory (24) has a critical-error condition and activates a spare memory portion (37) of the nonvolatile memory (22) in presence of the critical-error condition.
Abstract:
The present invention relates to an integrated memory system (1) comprising at least a non volatile memory (2) and an automatic storage error corrector, and wherein the memory (2) is connected to a controller (3) by means of an interface bus (4). Advantageously, the system comprises in the memory (2) circuit means, functionally independent, each being responsible for the correction of a predetermined storage error; at least one of said means generating a signal (IRQ) to ask a correction being external to the memory (2).
Abstract:
The invention relates to a method for replacing failed non-volatile memory cells, and to a corresponding non-volatile memory device of the programmable and electrically erasable type implementing the method, and comprising a memory cell array (4) organized in a row-and-column layout, and divided in array sectors (20), including at least one row decode circuit portion being supplied positive and negative voltages (Vpcx,HVNEG). The method is applied whenever the result of the erase algorithm is negative, and comprises the following steps:-
forcing an incompletely erased sector (20) into a read condition; scanning the rows of said sector (20) to check for the possible presence of a spurious current indicating a fail state; identifying and electrically isolating the failed row; re-addressing from said failed row to a redundant row provided in the same sector (20); re-starting the erase algorithm.
Abstract:
The method for using a nonvolatile memory (1) having a plurality of cells (14), each of which stores a datum, is based upon the steps of performing an modification operation of erasing/programming (22) the data of the memory; verifying (23) the correctness of the data of the memory cells; and, if the step of verifying (23) has revealed at least one incorrect datum, correcting on-th-field (46) the incorrect datum, using an error correcting code. The verification (23) of the correctness of the data is performed by determining (23) the number of memory cells storing an incorrect datum; if the number of memory cells storing the incorrect datum is less than or equal to a threshold (46), the erroneous datum is corrected by the error correction code; otherwise, new erasing/programming pulses are supplied.