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公开(公告)号:KR1019950011032B1
公开(公告)日:1995-09-27
申请号:KR1019920020985
申请日:1992-11-10
Applicant: 한국전자통신연구원
IPC: H01L29/80
Abstract: The device consists of a semi-insulating semiconductor substrate, a buffer layer which is undoped by impurities that exist on some top parts of the semiconductor substrate, a spacer layer in which 2 dimensional electron gas is formed, a carrier source layer which is doped by impurities that is formed on the top part of the spacer layer, a cap layer which is formed on the top part of the carrier source layer, a gate electrode which is formed on the top part of the cap layer, and a source and a drain electrodes which are formed to be contacted with the 2 dimensional electron gas.
Abstract translation: 该器件包括半绝缘半导体衬底,不存在于半导体衬底的一些顶部上的杂质的缓冲层,形成二维电子气的隔离层,由 在间隔层的顶部形成的杂质,形成在载体源层的顶部的盖层,形成在盖层的顶部的栅电极,以及源极和漏极 形成为与二维电子气接触的电极。
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