公开(公告)号：DE10033269A1

公开(公告)日：2002-01-31

申请号：DE10033269

申请日：2000-07-10

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN

IPC: G02B21/06 ,  G02B21/00 ,  G02F1/11 ,  G02F1/33 ,  G02B27/10 ,  G02B26/02

Abstract: The present invention concerns an apparatus for coupling light (1) of at least one wavelength of a laser light source (2) into an optical assemblage (3), preferably into a confocal scanning microscope, having an optically active component (4) that serves in particular to select the wavelength and to set the power of the coupled-in light (5). To ensure that changes in the power and/or wavelength of the laser light source do not affect the power of the light (5) coupled into the optical assemblage, the apparatus according to the present invention is characterized in that in order to influence the coupled-in light (5), the component (4) serves as the adjusting element of a control system (11).

公开(公告)号：GB2364610A

公开(公告)日：2002-01-30

申请号：GB0111032

申请日：2001-05-04

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN

IPC: G02B26/10 ,  G02B21/00 ,  G02B21/36 ,  G02B9/04

Abstract: A method of scanning an object with a light beam 2 from a light source 3, preferably in confocal microscopy, comprises deflecting the beam by a beam deflection device 4 and controlling the scanning operation of the beam by a control device 5. A control signal 11 may be delivered to trigger an event which may be an external influence to affect the object or a measurement operation. The timing of the control signal is dependent upon the position of the scanning beam relative to at least one definable scan position. Therefore, when the scanning beam reaches a position that may be before, at or after the definable scan position, the control signal is delivered to influence the object or commence a measurement operation.

公开(公告)号：DE10031720A1

公开(公告)日：2002-01-10

申请号：DE10031720

申请日：2000-06-29

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN

IPC: G02B7/02 ,  B25J7/00 ,  G02B7/14 ,  G02B7/16 ,  G02B21/00 ,  G02B21/24

Abstract: A holder defines the required position (5a) of the objective lens. During change over of the objective (5), it can be moved near the holder (26) with its longitudinal axis (6) essentially coaxial with the optical axis.

公开(公告)号：DE10115590A1

公开(公告)日：2001-12-20

申请号：DE10115590

申请日：2001-03-29

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  ENGELHARDT JOHANN ,  MOELLMANN KYRA

IPC: G02B6/00 ,  G02B5/00 ,  G02B5/04 ,  G02B5/18 ,  G02B5/22 ,  G02B6/02 ,  G02B6/12 ,  G02B6/122 ,  G02B6/255 ,  G02B21/00 ,  G02B21/06 ,  G02B27/00 ,  G02F1/39 ,  H01S3/00 ,  H01S3/16 ,  G02F2/02

Abstract: The arrangement has a scanning microscope e.g. confocal microscope, and a laser formed as a pulsed laser (1). An optical component is positioned between the laser and a lens (12), where light generated by the laser is spectrally processed by a unique cycle such that a spectral illumination light is emitted from the laser. An optical fiber (20) forms the optical component, and is comprised of photonic-bad-gap material. An optical diode is provided between the laser and fiber for suppressing back reflection of light rays originated from ends of the fiber.

公开(公告)号：DE10001954A1

公开(公告)日：2001-06-07

申请号：DE10001954

申请日：2000-01-18

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  BRADL JOACHIM

IPC: G02B21/00

公开(公告)号：DE19944148A1

公开(公告)日：2001-03-29

申请号：DE19944148

申请日：1999-09-15

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  ULRICH HEINRICH ,  HAY WILIAM C

IPC: G01N21/63 ,  G02B21/00

Abstract: The microscope has an illumination beam path between a laser light source (1,2) and an object (3), and a detection beam path (7) between the object and a detector (6). At least one reference beam path (9) is provided for reference measurements. Reference light is coupled from the illumination beam path into the reference beam path. The reference light is qualitatively and/or quantitively detected by the detector (6). A scattering optical component (11) and/or a beam deflector (25) may be arranged in the reference beam path. An Independent claim is included for a method of reference correction in a laser scanning microscope.

公开(公告)号：DE19906763A1

公开(公告)日：2000-08-31

申请号：DE19906763

申请日：1999-02-17

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN

IPC: G02B21/00

Abstract: In an apparatus, in particular, for calibration of confocal laser scanning microscopes, in which an object (1) is scanned by a scanner beam (2), in the plane (11) of an intermediate image is a calibrating means (12) which is also scanned by the beam (2). An Independent claim is also included for the calibration of such microscopes. It involves additional scanning of the calibrating means in an intermediate image plane.

公开(公告)号：DE19858456A1

公开(公告)日：2000-07-06

申请号：DE19858456

申请日：1998-12-18

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN

IPC: G01N21/64 ,  G01N21/17 ,  G01N27/447 ,  G01N37/00 ,  G02B21/00 ,  G06T7/00 ,  G01N33/483 ,  G01N35/00

Abstract: A method for localizing, picking up and optionally evaluating object structures, especially objects placed on supports (14), more particularly fluorescent object structures such as gene spots (15), whereby a microscope with a CCD camera, a scanning microscope or a preferably confocal laser scan microscope are used to pick up said objects. The inventive method provides rapid and reliable detection of object structures and is characterized in that image data is picked up by means of an illumination model that is projected onto the plane (5) of said objects.

公开(公告)号：DE19906769A1

公开(公告)日：1999-12-16

申请号：DE19906769

申请日：1999-02-17

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  ULRICH HEINRICH

IPC: G02B6/42 ,  G01M11/02 ,  G01J1/42 ,  G02B6/00

Abstract: The arrangement has an output coupling device (4) in the light path between the light source (2) and the optical component (3) for coupling out a small fraction of the light, a detector (7) for detecting the light intensity of the light coupled out, an electronic evaluation unit (8) for comparing the detected intensity with a predefined maximum value and a device (9) for reducing the light power or for switching off the light incident upon the optical components if the maximum power is exceeded.

公开(公告)号：DE19906757A1

公开(公告)日：1999-12-02

申请号：DE19906757

申请日：1999-02-17

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  ULRICH HEINRICH ,  BRADL JOACHIM

IPC: G02B21/00 ,  G02B5/32 ,  G02F1/33

Abstract: The arrangement has at least one spectrally selective element (4) for coupling the stimulation light from at least one light source (2) into the microscope and for stopping the stimulation light reflected and scattered at the object (10) and the stimulation wavelengths from the light passing from the object over the detection beam path (12). Stimulation light of different wavelengths can be stopped by the spectrally selective element.