公开(公告)号：JP2002090661A

公开(公告)日：2002-03-27

申请号：JP2001187550

申请日：2001-06-21

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HAY WILIAM C ,  HOFMANN JUERGEN

IPC: G02B26/02 ,  G01Q30/08 ,  G02B21/00 ,  G03B9/10 ,  G03B9/14

Abstract: PROBLEM TO BE SOLVED: To provide an optical device which has a simple structure and is safe with respect to human bodies, and a shutter for the light beam from a light source. SOLUTION: The optical device having a light source, in particular a laser light source and a cut-off device (1) for the light beam (2) from the light source, in particular a laser scanning microscope, has a means (3) of monitoring the operation state of the cutoff device (1) in the cut-off device (1). The shutter has at least two movable structure members (6, 7) which are so formed and arranged, so that mechanical shocks (impulses) generated by at least one moved structure members (6) is compensated (relaxed) by the movement of at least another structure member (7).

公开(公告)号：JP2001147376A

公开(公告)日：2001-05-29

申请号：JP2000280593

申请日：2000-09-14

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  ULRICH HEINRICH ,  HAY WILIAM C

IPC: G01N21/63 ,  G02B21/00

Abstract: PROBLEM TO BE SOLVED: To provide a method for executing absolute measurement of various objects with sufficient accuracy and correcting disturbances to a measurement condition in a laser scan microscope, especially, a confocal laser scan microscope. SOLUTION: At least one reference optical path 9 used for reference measurement is installed. Reference light can be coupled to the reference optical path 9 from an illumination optical path 4. A detection device 6 can detect the reference light qualitatively and (or) quantitatively.

公开(公告)号：DE19944148A1

公开(公告)日：2001-03-29

申请号：DE19944148

申请日：1999-09-15

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  ULRICH HEINRICH ,  HAY WILIAM C

IPC: G01N21/63 ,  G02B21/00

Abstract: The microscope has an illumination beam path between a laser light source (1,2) and an object (3), and a detection beam path (7) between the object and a detector (6). At least one reference beam path (9) is provided for reference measurements. Reference light is coupled from the illumination beam path into the reference beam path. The reference light is qualitatively and/or quantitively detected by the detector (6). A scattering optical component (11) and/or a beam deflector (25) may be arranged in the reference beam path. An Independent claim is included for a method of reference correction in a laser scanning microscope.

公开(公告)号：DE19944148C2

公开(公告)日：2003-08-21

申请号：DE19944148

申请日：1999-09-15

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  ULRICH HEINRICH ,  HAY WILIAM C

IPC: G01N21/63 ,  G02B21/00

Abstract: The microscope has an illumination beam path between a laser light source (1,2) and an object (3), and a detection beam path (7) between the object and a detector (6). At least one reference beam path (9) is provided for reference measurements. Reference light is coupled from the illumination beam path into the reference beam path. The reference light is qualitatively and/or quantitively detected by the detector (6). A scattering optical component (11) and/or a beam deflector (25) may be arranged in the reference beam path. An Independent claim is included for a method of reference correction in a laser scanning microscope.

公开(公告)号：DE50012594D1

公开(公告)日：2006-05-24

申请号：DE50012594

申请日：2000-09-02

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN DR ,  ULRICH HEINRICH DR ,  HAY WILIAM C

IPC: G01J3/44 ,  G01N21/63 ,  G02B21/00

Abstract: The microscope has an illumination beam path between a laser light source (1,2) and an object (3), and a detection beam path (7) between the object and a detector (6). At least one reference beam path (9) is provided for reference measurements. Reference light is coupled from the illumination beam path into the reference beam path. The reference light is qualitatively and/or quantitively detected by the detector (6). A scattering optical component (11) and/or a beam deflector (25) may be arranged in the reference beam path. An Independent claim is included for a method of reference correction in a laser scanning microscope.