Scheibenförmiges Trägersystem mit einer Mehrzahl integrierter Beugungsstrukturen
    101.
    发明公开
    Scheibenförmiges Trägersystem mit einer Mehrzahl integrierter Beugungsstrukturen 审中-公开
    ScheibenförmigesTrägersystemmit einer Mehrzahl integrierter Beugungsstrukturen

    公开(公告)号:EP1744199A1

    公开(公告)日:2007-01-17

    申请号:EP06117072.6

    申请日:2006-07-12

    Abstract: Die Erfindung betrifft ein kreisscheibenförmiges Trägersystem mit einer Mehrzahl integrierter Beugungsstrukturen zur Spektralzerlegung von Licht der Wellenlängen 340 - 800 nm, wobei jede Beugungsstruktur eine Schicht aus einem transparenten Kunststoff umfasst, die eine zur Beugung einer innerhalb des Wellenlängenspektrums des Lichts liegende Wellenlänge geeignete Mikrostruktur aufweist, und das Trägersystem mindestens zwei Beugungsstrukturen zur Beugung von Licht unterschiedlicher Wellenlänge umfasst.

    Abstract translation: 圆盘形载体系统(100)具有许多用于光谱分裂波长为340-800nm的光的集成衍射结构(1-38)。 每个衍射结构包括透明塑料层,其具有用于在波长光谱内的光衍射的波长合适的微结构。 载体系统包括用于不同波长的光的衍射的两个衍射结构。 还包括以下独立权利要求:(A)制造圆盘形载体系统的方法; 和(B)光度计。

    A METHOD OF AND A DEVICE FOR MEASURING OPTICAL RADIATION
    105.
    发明公开
    A METHOD OF AND A DEVICE FOR MEASURING OPTICAL RADIATION 失效
    设备和方法测量的光辐射。

    公开(公告)号:EP0631663A1

    公开(公告)日:1995-01-04

    申请号:EP93906641.0

    申请日:1993-03-19

    Applicant: RAUTARUUKKI OY

    Abstract: The invention relates to a method of and a device for measuring optical radiation. In the method, the intensity (2) of a radiation coming from an object (1) to be measured and to be lighted by collimated radiation is measured at several wavelength by focusing the radiation by an optical means (4) and a mirror means (6) on a detector group (3) comprising several detector elements (3a to 3d). The radiation coming from the object (1) to be measured is directed by the optical means (4) and the planar mirror means (6) in such a way that, by rotating the mirror means (6) tilted with respect to its axis (5) round this axis (5) and by keeping the radiation on the surface of the same planar mirror means (6), the focus (F) of radiation is moved in a detector plane (D) along a regular uninterrupted path (R) alternatingly over each detector element (3a to 3d) positioned substantially in the same plane and excited at a different wavelength.

    Spectrophotometer
    106.
    发明公开
    Spectrophotometer 失效
    分光光度计

    公开(公告)号:EP0506063A3

    公开(公告)日:1993-03-31

    申请号:EP92105251.0

    申请日:1992-03-27

    Abstract: A spectrophotometer including: a) a light source switching mechanism (20) for switching a plurality of light sources (1,2) by swinging a light source mirror (3); b) a filter selecting mechanism (19); c) a diffraction grating rotating mechanism (10); and d) a controller for determining the operation origins of the three driving mechanisms using a rough origin sensor (21) provided for the diffraction grating rotating mechanism and a photometer. The operation of the controller is to: i) determine an origin of the movement of the filter by making an end of the filter frame to touch a stopper; ii) determine a rough origin of the diffraction grating using the rough origin sensor; and iii) determine an origin of the movement of the light source mirror and a precise origin of the movement of the diffraction grating by detecting the position at which the photometer detects the maximum intensity of light.

    Spectroscopic measurement system
    107.
    发明公开
    Spectroscopic measurement system 失效
    Spektroskopische Messeinrichtung。

    公开(公告)号:EP0271602A1

    公开(公告)日:1988-06-22

    申请号:EP86117744.2

    申请日:1986-12-19

    Abstract: A spectroscopic measurement system comprises at least two kinds of diffraction gratings (1,2) whose grating surfaces are in line, an exchange device (3,4) for ex­changing the positions of the two kinds of diffraction gratings (1,2) in connection with incident light to be measured while the two kinds of diffraction gratings (1,2) are placed in a predetermined rotation angle, at least two kinds of detectors (5,6) having characteristics corresponding to those of the two kinds of diffraction gratings (1,2), respectively, a light path switch (7) for switching a path of diffraction light toward either of the two kinds of detectors (5,6), and a switch circuit (9) for switching the detection output of the two kinds of detectors (5,6) in synchronization with the exchange ope­ration of the two kinds of diffraction gratings (1,2).

    Abstract translation: 光谱测量系统包括至少两种其光栅表面在一起的衍射光栅(1,2),用于在连接中交换两种衍射光栅(1,2)的位置的交换装置(3,4) 在将两种衍射光栅(1,2)以预定的旋转角度放置的同时进行测量的入射光,至少两种具有与两种衍射光栅的特性相对应的特性的检测器(5,6) 1,2),分别用于将衍射光的路径切换到两种检测器(5,6)中的任一种的光路开关(7),以及用于切换两个检测器(5,6)的检测输出的开关电路(9) 各种检测器(5,6)与两种衍射光栅(1,2)的交换操作同步。

    光柵光譜機 GRATING SPECTROGRAPH
    109.
    发明专利
    光柵光譜機 GRATING SPECTROGRAPH 失效
    光栅光谱机 GRATING SPECTROGRAPH

    公开(公告)号:TW200602674A

    公开(公告)日:2006-01-16

    申请号:TW093120621

    申请日:2004-07-09

    IPC: G02B G01J

    Abstract: 本發明涉及一種光柵光譜機,依照光路經過該光譜機各元件之次序,該光譜機包括:一光源;一準直透鏡,使來自光源之光束平行;一繞射光學光柵,接收並使光束色散;一聚焦透鏡,聚焦上述色散光束,形成繞射光譜;一非球面透鏡,對上述繞射光譜進行分離;一數位微鏡設備,具有複數反射鏡片,反射上述繞射光譜;一色轉輪,合成上述繞射光譜圖;一投影鏡頭;及一顯示屏幕。本發明之光柵光譜機由於採用數位微鏡設備,無須將光信號轉換為電信號而可直接獲得較大光譜響應波長範圍之光譜訊息。

    Abstract in simplified Chinese: 本发明涉及一种光栅光谱机,依照光路经过该光谱机各组件之次序,该光谱机包括:一光源;一准直透镜,使来自光源之光束平行;一绕射光学光栅,接收并使光束色散;一聚焦透镜,聚焦上述色散光束,形成绕射光谱;一非球面透镜,对上述绕射光谱进行分离;一数码微镜设备,具有复数反射镜片,反射上述绕射光谱;一色转轮,合成上述绕射光谱图;一投影镜头;及一显示屏幕。本发明之光栅光谱机由于采用数码微镜设备,无须将光信号转换为电信号而可直接获得较大光谱响应波长范围之光谱消息。

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