Abstract:
PROBLEM TO BE SOLVED: To propose a method and an apparatus for measuring the accurate concentration of a chromophore which is strong against the changes in the length of a light route and the concentration of the chromophore. SOLUTION: The method for measuring the relative concentration of the chromophores in a tissue sample includes: a step for acquiring spectral data in a plurality of wavelengths; a step for determing the spectral value of the first derivative of the second order of the spectral data in the first wavelength; a step for determing the spectral value of the second derivative of the second order of the spectral data of the second wavelength; a step for obtaining the spectral value of the derivative of the second order scaled from information including the spectral values of the first and second derivatives of the second order; and a step for determing the relative concentrations of the chromophores from the information including a correlation for supplying the relative concentrations of the chromophores as the spectral value of the scaling derivative of the second order and the function of the spectral value of the scaling derivative of the second order. COPYRIGHT: (C)2004,JPO
Abstract:
A method for determining the composition and/or the concentration of gas in a sample using a spectrometer comprises: a step of measuring the adsorption signals of gas as a wavelength function; a step of converting the adsorption signals to one or more first induction signals; a step of inducing gas concentration measuring parameters from the first induction signals; and a step of determining the composition and/or the concentration of the gas from a calibration function which can compensate influences caused by the gas concentration measuring parameters, the parameters of device properties of the spectrometer, and the parameters of gas stages. In the step of measuring the adsorption signals of the gas, wavelengths continuously pass within a wavelength range, and are overlapped by harmonic wavelength modulation. Also, the influences of the wavelength modulation about the adsorption signals through light source modulation properties and the detection properties of the spectrometer follow the device properties of the spectrometer. The calibration function includes a parent calibration function and a device calibration function. Herein, one or more gas concentration measuring parameters induced from the induction signals and the parameters of the gas states are applied to the parent calibration function and are selected to compensate the light source modulation properties of the spectrometer. Also, the device calibration function considers the detection properties of the spectrometer. [Reference numerals] (13) Device properties; (14) Light source modulation properties; (15) Number of particles (N); (16) Detection properties; (17') Section y'f signal {F(y'f)}; (21) Concentration; (23) Ratio {V=F(xf)/F(yf)}; (25) Width xf signal {B(zf)}; (27) Parent calibration function {K_M(p, T, X, F, V, B)}; (29) Device calibration function (K_G); (AA) Pressure (p); (BB) Temperature (t); (CC) Carrier gas (X); (DD) Section xf signal {F(xf)}; (EE) Section yf signal {f(yf)}
Abstract:
본 발명은 샘플의 스펙트럼 특성을 검출하는 라만 분광 장치에 관한 것으로, 상기 라만 분광 장치는, 전자기 방사선을 이용하여 샘플을 여기시키도록 조정된 다중 변조된 분리형 광원과, 샘플에 의해 방출된 미리 지정된 파장을 분리하도록 조정된 필터로서, 파장은 다룬 주파수로 추가 변조되는 필터와, 분리된 파장을 검출하기 위한 검출기를 포함한다. 장치는 여기 에너지를 변조하도록 조정된 마이컬슨 간섭계와 같은 간섭계를 더 포함할 수 있다. 또한, 본 명세서의 방법, 시스템 및 키트는 라만 분광 장치를 포함한다.
Abstract:
PURPOSE: An analyzer for analyzing a spectrum transmitting through an anisotropic dielectric thin film is provided to allow incident light to be easily incident into the anisotropic dielectric thin film by removing lateral portions of the anisotropic dielectric thin film surrounded by a holder. CONSTITUTION: An analyzer for analyzing a spectrum transmitting through an anisotropic dielectric thin film includes two rotation stages(4,5) for freely rotating the anisotropic dielectric thin film in theta and phi-directions. Two connection rods(3) are fixedly inserted into the rotation stage(4) and a sample holder(2) for fixing the anisotropic dielectric thin film is connected to the connection rods(3) in order to freely rotate the anisotropic dielectric thin film fixed to the sample holder(2). The rotation stage(4) is longitudinally installed on the rotation stage(5).