Abstract:
A microscopy imaging system is disclosed that includes a light source system, a spectral shaper, a modulator system, an optics system, an optical detector and a processor. The light source system is for providing a first train of pulses and a second train of pulses. The spectral shaper is for spectrally modifying an optical property of at least some frequency components of the broadband range of frequency components such that the broadband range of frequency components is shaped producing a shaped first train of pulses to specifically probe a spectral feature of interest from a sample, and to reduce information from features that are not of interest from the sample. The modulator system is for modulating a property of at least one of the shaped first train of pulses and the second train of pulses at a modulation frequency. The optical detector is for detecting an integrated intensity of substantially all optical frequency components of a train of pulses of interest transmitted or reflected through the common focal volume. The processor is for detecting a modulation at the modulation frequency of the integrated intensity of substantially all of the optical frequency components of the train of pulses of interest due to the non-linear interaction of the shaped first train of pulses with the second train of pulses as modulated in the common focal volume, and for providing an output signal for a pixel of an image for the microscopy imaging system.
Abstract:
To avoid unstable light radiation during switching of a phase modulation amount and stimulate desired stimulation points simultaneously, provided is a photo-stimulator which includes an AOM switching on/off of radiation of stimulation light to a specimen S; an LCOS-SLM being capable of modulating a phase of stimulation light once radiation to the specimen S has been turned on by the AOM; and a controller controlling the LCOS-SLM to switch a phase modulation amount of stimulation light and controlling the AOM to switch on/off of radiation of stimulation light, wherein the controller causes the AOM to turn off radiation of stimulation light before the LCOS-SLM starts switching a phase modulation amount, and causes the AOM to turn on radiation of stimulation light after the LCOS-SLM completes switching a phase modulation amount.
Abstract:
A sensing system is provided that includes a transmitter assembly with a light source and a microdisplay device, wherein the transmitter assembly defines an optical beam transmission path to provide illumination of a substantially one-dimensional (1D) region of a target area, the microdisplay device comprising a plurality of controllable elements for causing the illumination to be a substantially 1D pattern of light along the 1D region. The system further includes a receiver assembly for defining a return optical signal transmission path from the 1D region and collecting return optical signals from the 1D region. The system also includes a processing component for generating sensor information associated with the 1D region by processing the return optical signals from the 1D region with return optical signals from adjacent 1D regions using a distributed compressive sensing (DCS) technique.
Abstract:
An apparatus includes a low-coherent light source configured to emit an electromagnetic wave; a spatial light modulator configured to modulate a wavefront of the electromagnetic wave; an interferometer including a movable mirror to set a depth of a medium to be irradiated by the electromagnetic wave and a beam splitter configured to the electromagnetic wave into a reference beam and an object beam; a detector to detect information about an interference pattern formed by the object beam coming from the medium via the beam splitter and the reference beam reflected by the movable mirror; and a controller configured to control the spatial light modulator, based on the information, to form a modulated wavefront for irradiating the medium.
Abstract:
A sensing system is provided that includes a transmitter assembly with a light source and a microdisplay device, wherein the transmitter assembly defines an optical beam transmission path to provide illumination of a substantially one-dimensional (1D) region of a target area, the microdisplay device comprising a plurality of controllable elements for causing the illumination to be a substantially 1D pattern of light along the 1D region. The system further includes a receiver assembly for defining a return optical signal transmission path from the 1D region and collecting return optical signals from the 1D region. The system also includes a processing component for generating sensor information associated with the 1D region by processing the return optical signals from the 1D region with return optical signals from adjacent 1D regions using a distributed compressive sensing (DCS) technique.
Abstract:
An optical system and associated method enable near real time optical phase conjugation. In the method, a translucent medium is illuminated by a sample illumination beam. Light scattered by the medium is directed to an electronic image sensor while a reference beam is also directed to the electronic image sensor. The scattered light and the reference beam form an interference pattern at the electronic image sensor. A digital representation of the interference pattern is recorded using the electronic image sensor, and the characteristics of a conjugate of the sample beam are computed from the numerical representation. A conjugate beam having the computed characteristics is generated using a configurable optical element and directed back to the translucent medium. The generation of the conjugate beam may be accomplished using a spatial light modulator.
Abstract:
The present invention provides a light source apparatus capable of producing stable oscillation and performing high-speed wavelength sweeping over a desired wavelength range.A swept light source apparatus in which oscillation wavelength is continuously changeable is provided. The apparatus includes, inside a resonator, an optical amplification medium that amplifies light, a first device configured to disperse light emitted from the optical amplification medium and thus produce beams having different wavelengths, a second device functioning as a non-focusing optical element and configured to collimate the beams having different wavelengths resulting from the dispersion by the first device, and a selecting device configured to select a beam having a specific wavelength from among the beams collimated by the second device. The beam having the specific wavelength selected by the selecting device is fed back to the optical amplification medium.
Abstract:
An optical system and associated method enable near real time optical phase conjugation. In the method, a translucent medium is illuminated by a sample illumination beam. Light scattered by the medium is directed to an electronic image sensor while a reference beam is also directed to the electronic image sensor. The scattered light and the reference beam form an interference pattern at the electronic image sensor. A digital representation of the interference pattern is recorded using the electronic image sensor, and the characteristics of a conjugate of the sample beam are computed from the numerical representation. A conjugate beam having the computed characteristics is generated using a configurable optical element and directed back to the translucent medium. The generation of the conjugate beam may be accomplished using a spatial light modulator.
Abstract:
An optical inspection system or tool can be configured to inspect objects using dynamic illumination where one or more characteristics of the illumination is/are adjusted to meet the inspection needs of different areas. For example, the illumination intensity may be increased or decreased as the tool inspects areas of memory and periphery features in a wafer die. In some embodiments, the adjustment can be based on data obtained during a pre-inspection setup sequence in which images taken based on illumination with varying characteristics are evaluated for suitability in the remainder of the inspection process.
Abstract:
A new architecture for machine vision system that uses area sensor (or line sensor), with telecentric imaging optics compound with telecentric illumination module is described. The illumination module may include a bright field illumination source and/or a dark field illumination source. The telecentric imaging optics includes an upper imaging module having an aperture stop and a lower imaging module positioned between the upper imaging module and object, such that the light source and the aperture stop are located in the back focal plane of the lower imaging module. The lower imaging module images the illumination source into a plane of an aperture stop of the upper imaging module. The optical axis of the upper imaging module is offset with respect to the lower imaging module. The optical axis of the telecentric illumination module is offset with respect to the axis of the lower imaging module in the opposite direction.