公开(公告)号：DE10043986A1

公开(公告)日：2002-03-14

申请号：DE10043986

申请日：2000-09-05

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN ,  KNEBEL WERNER

IPC: G01N21/64 ,  G02B21/00

Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises, in the interest of reliable definition of details or regions of interest of the specimen (11), the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished, at least one manipulation in at least one region (25) being performed by means of the illumination. Also described is a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for a specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11), means for acquiring a preview image and means for marking at least one region of interest in the preview image being provided, such that individual illuminating light beam wavelengths and/or illuminating light beam power levels can be allocated to the region or regions, and the region or regions of the specimen (11) can be illuminated in accordance with the allocation, and such that at least one manipulation in at least one region (25) can be performed by means of the illumination.