Encoder and decoder for RLL codes
    184.
    发明公开
    Encoder and decoder for RLL codes 有权
    Codierer und DecodiererfürRLL Codes

    公开(公告)号:EP1808963A1

    公开(公告)日:2007-07-18

    申请号:EP07075267.0

    申请日:2000-09-20

    CPC classification number: H03M13/098 G11B20/14 G11B20/18 H03M13/09

    Abstract: An encoder for encoding data, the encoder operable to generate a code word comprising: a first group of data bits; code bits that represent a second group of data bits; and a minimum probability of transitions among the code bits.

    Abstract translation: 一种用于编码数据的编码器,所述编码器可操作以产生代码字,包括:第一组数据位; 表示第二组数据位的代码位; 以及码位之间的最小转换概率。

    Test mode and test method for a temperature tamper detection circuit
    185.
    发明公开
    Test mode and test method for a temperature tamper detection circuit 有权
    温度篡改检测电路的测试模式和测试方法

    公开(公告)号:EP1788579A1

    公开(公告)日:2007-05-23

    申请号:EP06255928.1

    申请日:2006-11-21

    CPC classification number: G01K3/005 G01K7/015 G01K15/00

    Abstract: An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature. A comparator then compares the selected measured voltage across the base-emitter of the bipolar transistor against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage across the base-emitter of the bipolar transistor against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to one of either a too cold or too hot temperature. In a test mode, the circuit is exposed to a readily available temperature, such as room temperature, and the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter are scaled in accordance with that available temperature for application to the comparator. Alternatively, in test mode the reference voltages are scaled to intersect with the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter at the available temperature.

    Abstract translation: 集成电路温度传感器包括感测电路,该感测电路可操作以确定集成电路当前是否暴露于较低温度或较高温度中的一个。 如果所述感测电路指示所述集成电路当前暴露于相对较低的温度,或者可替换地选择所述集成电路的双极晶体管的双极晶体管的双极晶体管的双极晶体管的双极晶体管的基极 - 发射极之间的测量电压, 如果感测电路指示集成电路当前暴露于相对高的温度,则集成电路的双极晶体管的基极 - 发射极。 比较器然后将双极晶体管的基极 - 发射极之间的选定测量电压与指示过冷温度条件的第一参考电压进行比较,或将双极晶体管的基极 - 发射极之间的选定测量德耳塔电压与第二参考电压 指示温度过高的情况。 作为比较的结果,可以检测集成电路当前是否暴露于太冷或太热的温度之一。 在测试模式下,电路暴露于容易获得的温度下,例如室温,并且基极 - 发射极两端的测量的Δ电压和/或基极 - 发射极两端的测量电压根据可用的温度 应用于比较器。 或者,在测试模式中,参考电压被缩放以与在基极 - 发射极之间测量的德耳塔电压和/或在可用温度下基极 - 发射极之间的测量电压相交。

    Local oscillator with injection pulling suppression and spurious products filtering
    186.
    发明公开
    Local oscillator with injection pulling suppression and spurious products filtering 有权
    Lokaloszillator mitUnterdrückungdes Mitziehens der Frequenz undStörsignalfilterung

    公开(公告)号:EP1775843A1

    公开(公告)日:2007-04-18

    申请号:EP06255210.4

    申请日:2006-10-10

    Abstract: A single sideband mixer circuit includes a voltage controlled oscillator operable to provide a tunable frequency f1. The mixer circuit outputs a frequency signal at a frequency f1 ± f2. A tracking filter operates to filter the frequency signal and generate a first output signal at the frequency f1 ± f2. A resonance frequency fr of the tracking filter is tunable to substantially match the frequency f1 ± f2 of the frequency signal. The output signal of the tracking filter may be processed by a phase lock loop circuit to generate a control signal for controlling the setting of the tunable frequency f1 and resonance frequency fr. Alternatively, the output signal of the tracking filter may be divided and the divided signal processed by a phase lock loop circuit to generate the control signal for controlling setting of the tunable frequency f1 and resonance frequency fr.

    Abstract translation: 单个边带混频器电路包括可操作以提供可调谐频率f1的压控振荡器。 混频器电路以f1±f2的频率输出频率信号。 跟踪滤波器用于对频率信号进行滤波并产生频率为f1±f2的第一输出信号。 跟踪滤波器的谐振频率fr可调,以使频率信号的频率f1±f2基本匹配。 跟踪滤波器的输出信号可以由锁相环电路来处理,以产生用于控制可调频率f1和谐振频率fr的设置的控制信号。 或者,跟踪滤波器的输出信号可以被分频,并且由锁相环电路处理的分频信号产生用于控制可调谐频率f1和谐振频率fr的设置的控制信号。

    Programmable priority encoder
    187.
    发明公开
    Programmable priority encoder 有权
    可编程优先级编码器

    公开(公告)号:EP1750280A3

    公开(公告)日:2007-04-11

    申请号:EP06253766.7

    申请日:2006-07-19

    Inventor: Lysinger, Mark

    CPC classification number: G11C15/04

    Abstract: A programmable priority encoder is disclosed for use with the device such as a Content Addressable Memory (CAM) device having a plurality of array objects to be encoded in binary and arranged in row and columns. Match lines are adapted to be connected to a plurality of arrayed objects associated with respective rows. A plurality of encoder cells, each having a memory element and forming an encoder block are arranged in rows. Precharged bus lines are operative with the encoder cells and match lines. The precharged bus lines are discharged indicating a match and priority is assigned to rows based on logic values stored within the memory elements of the encoder cell.

    Apparatus and method for implementing a rom patch using a lockable cache
    188.
    发明公开
    Apparatus and method for implementing a rom patch using a lockable cache 审中-公开
    装置和方法,用于通过可锁定的高速缓存修改ROM​​存储器

    公开(公告)号:EP1363189A3

    公开(公告)日:2007-03-21

    申请号:EP03253004.0

    申请日:2003-05-14

    CPC classification number: G06F9/328 G06F8/66 G06F9/3004 G06F9/30087 G06F12/126

    Abstract: A ROM patching apparatus for use in a data processing system that executes instruction code stored the ROM. The ROM patching apparatus comprises: 1) a patch buffer for storing a first replacement cache line containing a first new instruction suitable for replacing at least a portion of the code in the ROM; 2) a lockable cache; 3) core processor logic operable to read from an associated memory a patch table containing a first table entry, the first table entry containing 1) the first new instruction and 2) a first patch address identifying a first patched ROM address of the at least a portion of the code in the ROM. The core processor logic loads the first new instruction from the patch table into the patch buffer, stores the first replacement cache line from the patch buffer into the lockable cache, and locks the first replacement cache line into the lockable cache.

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