Signal processing in guided wave cutoff spectroscopy
    181.
    发明申请
    Signal processing in guided wave cutoff spectroscopy 有权
    导波截止光谱信号处理

    公开(公告)号:US20130024150A1

    公开(公告)日:2013-01-24

    申请号:US13136079

    申请日:2011-07-21

    Applicant: Tom Lee Erb

    Inventor: Tom Lee Erb

    Abstract: The present invention includes a guided microwave spectroscopy system (1) that eliminates the need for an automatic gain control feature by providing multiple signal processing paths having differing fixed voltage gains. An emitted signal which exits a test chamber (2) containing a material under test is simultaneously amplified by at least a first fixed gain amplifier (4) and a second fixed gain amplifier (7). The output signal of each amplifier is separately digitized and then normalized for further digital signal processing by a computer (13) in order to determine parameters of the material under test which may have variable microwave radiation characteristics that are a function of the frequency of the signal emitted into the test chamber. During the signal processing step a system clock (121) causes the computer to sample only an integral number of complete output signal cycles. A calibration protocol (136-154) is conducted based on laboratory samples of each potential material to be processed by the system (1).

    Abstract translation: 本发明包括一种通过提供具有不同固定电压增益的多个信号处理路径来消除对自动增益控制特征的需要的导向微波光谱系统(1)。 离开包含待测材料的测试室(2)的发射信号由至少第一固定增益放大器(4)和第二固定增益放大器(7)同时放大。 每个放大器的输出信号被分开地数字化,然后被归一化用于由计算机(13)进一步的数字信号处理,以便确定待测材料的参数,其可以具有作为信号频率的函数的可变微波辐射特性 发射到测试室。 在信号处理步骤期间,系统时钟(121)使得计算机只对整数个完整的输出信号周期进行采样。 基于由系统(1)处理的每个潜在材料的实验室样品,进行校准协议(136-154)。

    Control system and apparatus for use with ultra-fast laser
    182.
    发明授权
    Control system and apparatus for use with ultra-fast laser 有权
    用于超快激光的控制系统和设备

    公开(公告)号:US07973936B2

    公开(公告)日:2011-07-05

    申请号:US11219572

    申请日:2005-09-02

    Applicant: Marcos Dantus

    Inventor: Marcos Dantus

    CPC classification number: H01J49/164 G01J3/00 G01J11/00 G01N21/00

    Abstract: A control system and apparatus for use with an ultra-fast laser is provided. In another aspect of the present invention, the apparatus includes a laser, pulse shaper, detection device and control system. A multiphoton intrapulse interference method is used to characterize the spectral phase of laser pulses and to compensate any distortions in an additional aspect of the present invention. In another aspect of the present invention, a system employs multiphoton intrapulse interference phase scan. Furthermore, another aspect of the present invention locates a pulse shaper and/or MIIPS unit between a laser oscillator and an output of a laser amplifier.

    Abstract translation: 提供了一种与超快速激光一起使用的控制系统和装置。 在本发明的另一方面,该装置包括激光器,脉冲整形器,检测装置和控制系统。 使用多光子脉冲间干涉法来表征激光脉冲的光谱相位并补偿本发明的另外方面的任何失真。 在本发明的另一方面,一种系统采用多光子脉冲间干涉相位扫描。 此外,本发明的另一方面在激光振荡器和激光放大器的输出之间定位脉冲整形器和/或MIIPS单元。

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