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    PROCEDE ET SYSTEME D'IMAGERIE PAR MICROSCOPIE INTERFERENTIELLE PLEIN CHAMP
    12.
    发明公开
    PROCEDE ET SYSTEME D'IMAGERIE PAR MICROSCOPIE INTERFERENTIELLE PLEIN CHAMP 审中-公开
    全场干涉显微成像的方法和系统

    公开(公告)号：EP3281053A1

    公开(公告)日：2018-02-14

    申请号：EP16719232.7

    申请日：2016-04-08

    Applicant: LLtech Management

    Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice

    IPC: G02B21/00 ,  G01B9/02 ,  G02B21/14 ,  G01N21/47 ,  G02B21/18

    CPC classification number: G02B21/125 ,  G01B9/02091 ,  G01N21/47 ,  G01N21/4795 ,  G01N2021/4709 ,  G02B21/0004 ,  G02B21/082 ,  G02B21/14 ,  G02B21/18 ,  G06T1/0007 ,  G06T5/50 ,  G06T2207/10101

    Abstract: The invention relates to a system (20) for full-field interference microscopy imaging of a three-dimensional diffusing sample (206). Said system includes: - an interference device (200) including a reference arm on which a reflective surface (205) is arranged, the interference device being suitable for producing, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave, obtained by reflection of incident light waves onto a basic surface of the reflective surface (205) corresponding to said point of the imaging field, and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; - an acquisition device (208) suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and - a processing unit (220) configured to calculate an image (IB, IC) representing temporal variations in intensity between said N two-dimensional interferometric signals.

    OPTICAL TISSUE SECTIONING USING FULL FIELD OPTICAL COHERENCE TOMOGRAPHY
    14.
    发明公开
    OPTICAL TISSUE SECTIONING USING FULL FIELD OPTICAL COHERENCE TOMOGRAPHY 有权
    OPTISCHE GEWEBESCHNITTE UNTER VERWENDUNG VON OPTISCHER VOLLFELD-KOHÄRENZTOMOGRAFIE

    公开(公告)号：EP2615967A1

    公开(公告)日：2013-07-24

    申请号：EP11767663.5

    申请日：2011-09-19

    Applicant: LLtech Management

    Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

    IPC: A61B5/00

    CPC classification number: H04N7/18 ,  A61B5/0066 ,  A61B5/0068

    Abstract: According to a first aspect, the invention relates to a multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising: - a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer with a detection sub system (208, 408, 608) and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (203, 403, 603), - a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (623), means (421, 422) for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (624), optically conjugated with said focal plane of the microscope objective.

    Abstract translation: 根据第一方面，本发明涉及一种用于体积和散射样品的全场成像的多峰光学分段显微镜（200,400,600），包括： - 全场OCT系统，用于提供第一部分的图像 包括照明子系统（201,401,601）和具有检测子系统（208,408,608）的全场成像干涉仪的样本的深度以及用于将样本和所述检测光学共轭的光共轭装置 子系统，其中所述光共轭装置包括显微镜物镜（203,403,603）， - 用于提供所述样品深度的第二部分的荧光图像的辅助全场光学分割成像系统，所述辅助全场光学分割成像系统包括具有 照明子系统（623），用于在所述全场成像干涉仪的所述显微镜物镜的焦平面处产生可变空间图案照明的装置（421,422），以及 检测子系统（624），与所述显微镜物镜的所述焦平面光学共轭。

    METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY
    17.
    发明公开
    METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY 有权
    方法和装置满场干涉显微镜高分辨

    公开(公告)号：EP2572157A1

    公开(公告)日：2013-03-27

    申请号：EP11723374.2

    申请日：2011-05-17

    Applicant: LLtech Management

    Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

    IPC: G01B9/02 ,  G01B21/00 ,  G01N21/45

    CPC classification number: G01B9/02 ,  G01B9/02068 ,  G01B9/02082 ,  G01B9/02091 ,  G01B9/04 ,  G02B21/0056 ,  G02B26/06

    Abstract: The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.

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